Benning IT 130 - RCD Testing

BENNING IT 130 Measurements
- 27 -
4.4.5 RCD testing
In this menu, it is possible to set the standard
used for RCD testing.
Figure 4.8:
Selecting the RCD standard
Keys used:
UP / DOWN
Selects the standard
TEST
Confirms the selected standard and returns to the Settings menu
ESC
Back / cancel to the Settings menu
Function selector switch
Back / cancel to the selected measuring function
The maximum RCD tripping times vary from standard to standard.
The times specified in the individual standards are listed in the following.
By default, the tripping times in compliance with the EN 60364-4-41 standard are preset. The
EN 60364-4-41 standard defines different tripping times for TN/IT networks and TT networks as
can be seen in table 41.1.
Tripping times in compliance with EN 60364-4-41:
Uo
½×I
∆N
*)
I
∆N
2×I
∆N
5×I
∆N
≤120 V
t
∆
> 800 ms t
∆
≤ 800 ms
TN/IT
≤230 V
t
∆
> 400 ms t
∆
≤ 400 ms
≤120 V
t
∆
> 300 ms t
∆
≤ 300 ms
TT
≤230 V
t
∆
> 200 ms t
∆
≤ 200 ms
t
∆
< 150 ms t
∆
< 40 ms
Uo: Nominal voltage of external conductor to earth
Example of a tripping time evaluation for I∆
N
, Uo: ≤230 V
Setting Tripping time t
∆
Evaluation field
IEC 60364-4-41 TN/IT < 400 ms
400 ms < t
∆
< 999 ms
> 999 ms
IEC 60364-4-41 TT < 200 ms
200 ms < t
∆
< 999 ms
> 999 ms
Tripping times in compliance with EN 61008/EN 61009:
½×I
∆N
*)
I
∆
N 2×I
∆N
5×I
∆N
Standard RCDs
(undelayed)
t
∆
> 300 ms t
∆
< 300 ms t
∆
< 150 ms t
∆
< 40 ms
Selective RCDs
(delayed)
t
∆
> 500 ms 130 ms< t
∆
< 500 ms 60 ms< t
∆
< 200 ms 50 ms< t
∆
< 150 ms
Tripping times in compliance with BS 7671:
½×I
∆N
*)
I
∆
N 2×I
∆N
5×I
∆N
Standard RCDs
(undelayed)
t∆> 1999 ms t
∆
< 300 ms t
∆
< 150 ms t
∆
< 40 ms
Selective RCDs
(delayed)
t∆> 1999 ms 130 ms< t
∆
< 500 ms 60 ms< t
∆
< 200 ms 50 ms< t
∆
< 150 ms