Benning IT 130 - Isc Factor (Scaling Factor)

BENNING IT 130 Measurements
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Tripping times in compliance with AS/NZS 3017
**)
:
½×I
∆N
*)
I
∆
N 2×I
∆N
5×I
∆N
RCD type
I
∆N
[mA] t
∆
t
∆
t
∆
t
∆
Remark
I
≤ 10
40 ms
40 ms
40 ms
II
> 10 ≤ 30
300 ms
150 ms
40 ms
III > 30
> 999 ms
300 ms
150 ms
40 ms
500 ms
200 ms
150 ms
maximum tripping time
IV
S
> 30 > 999 ms
130 ms
60 ms
50 ms
minimum non-tripping time
*)
Minimum testing time for a current of ½×I
∆N
, RCD must not trip
**)
Testing current and measuring accuracy correspond to the requirements specified by
AS/NZS 3017
Maximum testing times and selected testing current for standard (undelayed) RCDs:
Standard
½×I
∆N
I
∆
N 2×I
∆N
5×I
∆N
EN 60364-4-41 1000 ms
1000 ms
150 ms
40 ms
EN 61008 / EN 61009 300 ms
300 ms
150 ms
40 ms
BS 7671 2000 ms
300 ms
150 ms
40 ms
AS/NZS 3017 (I, II, III) 1000 ms
1000 ms
150 ms
40 ms
Maximum testing times and selected testing current for selective (delayed) RCDs:
Standard
½×I
∆N
I
∆
N 2×I
∆N
5×I
∆N
EN 60364-4-41 1000 ms
1000 ms
200 ms
150 ms
EN 61008 / EN 61009 500 ms
500 ms
200 ms
150 ms
BS 7671 2000 ms
500 ms
200 ms
150 ms
AS / NZS 3017 (IV) 1000 ms
1000 ms
200 ms
150 ms
4.4.6 Isc factor (scaling factor)
In this menu, it is possible to set the Isc factor
(scaling factor) for calculating the short-circuit
current (Ik) in the functions ZI (L-N/L) and Zs
(L-PE).
Figure 4.9:
Selecting the Isc factor
Keys used:
UP / DOWN
Modifies the Isc factor
TEST
Confirms the adjusted Isc factor
ESC
Back / cancel to the Settings menu
Function selector switch
Back / cancel to the selected measuring function
The short-circuit current Ik in the power supply system is of particular importance for the
selection and testing of protective circuits (fuses, overcurrent protection devices, RCDs).
The default value of the Isc factor (Ik) is 1.00. The value has to be set according to local
requirements.
The Isc factor can be set within the range of 0.20 ÷ 3.00.