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Overview
This document details the porting of the GCI E84 Emulator Test Suite into the GCI HHT.
Due to memory constraints, a subset of the E84 Emulator Test Suite is implemented. The HHT Test Suite is
functionally equivalent to the E84 Emulator Test Suite, with the following limitations:
• Limited status messages
• No user comment entry
• No support for running TP tests using an Unload Cycle
• No Static Tests
• No Passive Test Mode under Emulator Test Suite
• No Continuous Test Mode under Emulator Test Suite
Pass / Fail test results, including failure codes, are maintained for each test in the HHT Test Suite. When
the HHT Test Suite has completed, or when the operator exits the HHT Test Suite, the test results data
structure can be saved into the HHT’s Paperless Storage System (PSS).
It is suggested that a hard-copy Test Procedure be used during testing that provides operator fields for
manual entry of test comments and UUT information. An example Test Procedure is included as an
appendix to this document.
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HHT to UUT Connection
The HHT provides three connection methods for testing E84 interfaces:
1. direct HHT is directly connected to the UUT’s E84 interface using a straight through, 25-
pin, male-to-female cable. E84 communications takes place through this
connecting cable.
2. external IR an IR Transceiver is connected to the HHT. This external IR Transceiver is aligned
with the UUT’s IR Transceiver. E84 communications takes place through the IR link
between the two Transceivers.
3. internal IR The HHT’s internal IR Transceiver is aligned with the UUT’s IR Transceiver. E84
communications takes place through the IR link between the HHT’s internal
Transceiver and the UUT’s Transceiver.
Test B (Verify Full Load / No Load Voltage) requires a direct connection. All other tests in the HHT Test Suite
can be performed using any of the available connection methods.