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IDEAL INDUSTRIES LANTEK User Manual

IDEAL INDUSTRIES LANTEK
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Chapter 7
Cable Testing Fundamentals
7-6
Wire Map Test
Wire Map testing is used to locate shorts, opens, and miswires. Test results are
displayed graphically for easy visual indication of any problems.
Note: The RH is required to perform this test.
Wire Map Errors
A failure in a Wire Map should always be the first problem corrected, since it
causes faults in other tests. One open pin can cause DC loop resistance and
attenuation tests to fail. An open may also cause a zero capacitance reading, and
will cause false readings in NEXT tests.
A wire map test will always look for and map all nine possible wires (four pairs +
shield) but will only consider wires defined as present in the selected cable type
(refer to Chapter 3, Changing a Cable Type) for pass/fail criteria. For example, a
wire that is not specified in the cable type will show on the map but will not cause
a test failure.
The Wire Map test guarantees the following minimum level of error detection
(based on four pairs of conductors, shield optional):
Any wiring error or combination of wiring errors will indicate a wire map
failure.

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IDEAL INDUSTRIES LANTEK Specifications

General IconGeneral
BrandIDEAL INDUSTRIES
ModelLANTEK
CategoryCable Tester
LanguageEnglish