Optical models Mie Theory and Fraunhofer Approximation.
Concentration range Patented Multiple Scattering Correction ( US Patent No.
5,619,324) enables operation at high concentrations.
Minimum acceptable transmission 5% (95% obscuration), dependent on particle size range
Detection system 36 element log-spaced silicon diode detector array.
Light source 632.8nm, 2mW helium-neon laser.
Optical alignment system Automatic rapid align system.
Maximum acquisition rate Continuous Mode: 1hz
Rapid Mode (Standard): 2.5kHz
Rapid Mode (Enhanced): 10kHz (requires software
feature key).
Maximum measurement time Continuous Mode: > 60 mins at 1Hz
Rapid Mode (Standard) 30 sec at 2.5 kHz
Rapid Mode (Enhanced) 30 sec at 10 kHz
Accuracy Better than +/- 1% on the Dv50 for NIST-traceable
latex standards.
Precision/Repeatability Better than +/- 1% COV on the Dv50 for NIST-traceable
latex standards.
Reproducibility between
instruments
Better than +/- 1% COV on the Dv50 for NIST-traceable
latex standards.
Triggering
Measurement triggering Internal: Based on transmission or light scattering levels
External: Based on TTL input or simple switch trigger
External device synchronisation Via two TTL trigger outputs
APPENDIX B
Spraytec
Page B.2 MAN 0368
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