7.6 System Test
Item Description Setting Method
5-01 Running test mode Paper transport test modes. The
following three types can be selected.
(1) Jam OFF: The jam detection, except
the inverter unit, sorter, and separation
(main body) jam detection, is disabled.
(2) SC OFF: The SC detection is
disabled.
(3) Blank copy: The exposing is not done.
* The total counter counts copies even in
these mode.
Press [5-01] of the system test menu.
⇓
Select "Jam OFF/SC OFF/Blank Copy".
⇓ (Screen will change)
Select the desired copy modes and press
the Start key.
5-02 Copy image The following adjustments can be done:
(1) Lead/trail erase: The leading and
trailing edge erase margins can be
adjusted separately in 1 mm steps.
(2) Side erase: Both side (front and rear)
erase margins can be adjusted
separately in 2.5 mm steps.
(3) Registration: The leading edge
registration can be adjusted in 0.5 mm
steps.
(4) Magnification: The magnification error
in the full size (100 %) mode can be
adjusted in 0.1 % steps.
(5) Side fence: The duplex side fences
width can be adjusted in 0.6 mm steps to
match with the used copy paper.
* The paper tray that was selected before
accessing the service tool will be used for
each adjustment.
CAUTION:
Repeat the side erase and side fence
adjustments for each of paper size that
will be used by the customer.
Press [5-02] of the system test menu.
⇓
Select the desired item key.
⇓
Change data using the arrow keys.
⇓
Press the Start key to make a copy.
⇓
Check the copy image.
5-03 Fusing temperature The fusing roller temperature can be
adjusted.
* When one of keys [0] to [15] is pressed,
the key may turn red. This means the
fusing lamp is ON.
* The standard temperature is between
173 and 177
o
C.
* The temperature increases or
decreases in 2
o
C steps.
Initial setting: 8 or 9
CAUTION:
Do not refer to the displayed temperature
on the screen to adjust the fusing
temperature. This does not show actual
fusing temperature.
Press [5-03] of the system test menu.
⇓
Adjust using keys [0] to [15] as follows.
Measured value < displayed value
Select a key of bigger value than
present.
Measured value > displayed value
Select a key of smaller value than
present.
System Test 1 July 1994
7-14