Technical Data
4.1 General Device Data
SIPROTEC, 7SD80, Manual
E50417-G1140-C474-A1, Release date 09.2011
288
4.1.5 Electrical Tests
Standards
Insulation Tests
1)
Protection circuits through surge arresters on the primary side
2)
(type test) not against protective conductor and internal electronic components. Protection circuits through
surge arresters on the primary side
3)
Voltage test without surge arresters (only type test), see also Section 3.1 Mounting and Connections
Standards: IEC 60255
IEEE Std C37.90, see individual functions
VDE 0435
for more standards see also individual functions
Standards: IEC 60255-27 and IEC 60870-2-1
High voltage test (routine test). All circuits except
power supply, binary inputs, communication inter-
faces and CU protection data interface
2.5 kV; 50 Hz
High voltage test (routine test). Auxiliary voltage and
binary inputs
3.5 kV DC
High voltage test (routine test): isolated communi-
cation interfaces (A and B)
500 V; 50 Hz
Voltage test (routine test) CU protection data inter-
face
1)
DC 70 V
Impulse voltage test (type test), all processor cir-
cuits against each other and against the grounding
terminal (except communication interface and CU
protection data interface) category III
5 kV (peak value);
1.2 µs/50 µs; 0.5 J;
3 positive and 3 negative impulses at intervals of 1 s
Impulse voltage test (type test), all processor cir-
cuits against the internal electronics (except com-
munication interface and CU protection data inter-
face)
6 kV (peak value);
1.2 µs/50 µs; 0.5 J;
3 positive and 3 negative impulses at intervals of 1 s
Impulse voltage test (type test), all processor cir-
cuits against the CU protection data interface
2)
6 kV (peak value);
1.2 µs/50 µs; 0.5 J;
3 positive and 3 negative impulses at intervals of 1 s
Voltage test (type test) only CU protection data in-
terface against all processor circuits
2)
DC 3.5 kV
Voltage test (type test) only CU protection data in-
terface against protective grounding terminal
3)
1.9 kV; 50 Hz