Performing Troubleshooting and Diagnostic Tests
7-6
Adapter Test Setup
The Configuration and Diagnostic Program is already set
up to run the Group 1 tests.
■ To change the test parameters, refer to the section
“Changing the Test Setup” later in this chapter.
■ To set up and run Group 2 or Group 3 tests, refer to
“Group 2 and Group 3 Test Setup” later in this
chapter.
Group 1 Tests
Group 1 tests the physical components, connectors, and
circuitry on the adapter. The tests include:
■ Register Access Test
This test verifies that the computer can access the
adapter’s registers correctly.
■ EEPROM Vital Data Test
This test verifies that the ASIC can access the
EEPROM and verifies the integrity of the
nonconfigurable data in the EEPROM.
■ EEPROM Configurable Data Test
This test verifies that the ASIC can access the
EEPROM and verifies the integrity of the user-
configurable data in the EEPROM.
■ Boot PROM Test
This test verifies that the computer can access the
boot PROM correctly and verifies the integrity of the
boot PROM. This test only appears in this on-screen
list if the boot PROM is installed.
■ FIFO Built-in Self-test
This test verifies the data integrity of the FIFO (first
in/first out) signals.
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