Ch. 10. Environmental Scanner Overview Sec. 10.3. Cypher ES Quick Reminder List
2.
Never load “non-flat” samples into the ES
scanner.
• Unlike the S scanner, the ES scanner
cannot accept “non-flat” samples.
• A “non-flat” sample is any sample in
which the region to be scanned is not
the tallest feature on the sample puck.
For example, the sample shown shown
on the left has a magnet glued to the
puck that is taller than the sample.
• Given the low profile of the ES
cantilever holders, it would not be
possible to engage on the sample shown
shown on the left since the magnet
would hit the cantilever holder before
the cantilever engaged on the sample.
• For electrical measurements, use the
low-profile electrical sample puck (as
shown on the right) provided in the
accessory kit.
Warning: Pay attention! Attempting to start-
ing a tip approach on a “non-flat” sample may
cause serious damage to your cantilever holder
and/or sample stage.
3.
Never touch the Heater sample stage with
your tweezers.
• The Heater sample stage is extremely
fragile. In order to achieve high
temperatures while still maintaining low
drift performance, the Heater Sample
Stage is constructed with fragile
ceramics.
• When loading/unloading the samples,
take care to never push directly on the
sample stage with your tweezers.
• When adjusting the lateral position of
the sample, use minimal force. Pushing
on the sample with too much force may
crack the heater.
Warning: Do not apply force to heater sample stage. It is fragile!
Note Although it is not required, lowering the
cantilever holder stage fully (with the can-
tilever holder removed!), will make it easier to
exchange samples without touching the heater
stage.
Warning: Pay attention! If you are care-
less when loading/unloading the Heater sam-
ple stage you will break it.
DRAFT
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