Eaton EMR-3MP0 - Trip Bypass Functionality; Trip Bypass Commissioning Example

4.15.2
Trip Bypass Functionality
Breaker Failure Protection for devices that o󰃠er current measurement
Trip Bypass
CBF_E91
2
51
14
Please Refer to Diagram: Blockings
(Element is not deactivated and no active blocking signals.)
Trip Bypass . Trip
Φ
IA
IB
IC
Trip Bypass . Pickup
Trip Bypass . Waiting for Trigger
1 s
0
0.1⋅In
OR
Prot . Trip
4.15.3
Trip Bypass Commissioning Example
Object to Be Tested:
Test of the »Trip Bypass« module.
Necessary Means:
• Current source;
• Ammeter; and
• Timer.
NOTICE!
When testing, the applied test current must always be higher than the device-internal
threshold 0.1⋅In.
If the test current falls below the threshold while the breaker is in the “O󰊍” position, no
pickup is generated.
Procedure (Single-Phase):
For testing the tripping time of the »Trip Bypass« module, a test current has to be higher
than the threshold value of one of a current protection module. The »Trip Bypass« trip
delay can be measured from the time when General Trip signal »Prot . Trip« becomes
active, to the time when the »Trip Bypass . Trip« signal becomes active.
To avoid wiring errors, make sure the breaker in the upstream system switches o󰊍.
The time, measured by the timer, should be in line with the speci󰊎ed tolerances.
Successful Test Result:
191www.eaton.comEMR-3MP0
4 Protective Elements
4.15 Trip Bypass [50BF/62BF]