Two-slit SAXS optics
SmartLab: Automated Multipurpose X-ray Diffractometer 7
Two-slit SAXS optics
The two-slit SAXS optics incorporating a multilayer mirror can perform
measurements with better accuracy and S/N ratios than conventional three-slit
SAXS optics. SmartLab Guidance handles previously difficult adjustments of
small-angle scattering optics. NANO-Solver, the analysis package for pore and
particle size distribution analysis, corrects scattered image distortion resulting
from optics based on the deconvolution of the slit function.
In-plane optics (2080B212)
The use of the in-plane arm and RxRy attachment enables measurements of
in-plane diffraction by maintaining grazing incidence conditions during sample
rotation. This allows the measurement of diffraction from lattice planes
perpendicular to the sample surface. High-precision measurement of orientation,
crystallinity, and distortion of thin films are possible without interference by
x-rays scattered or diffracted from the substrate. Reflection pole figure
measurements using the in-plane geometry eliminate the blind region at the pole
figure edge typically encountered with traditional out-of-plane reflection pole
figure measurements. Complete crystal orientation information is obtained from
the total-area pole figure. Conditions for optics alignment and sample alignment
are set automatically by SmartLab Guidance Package Measurements.
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