Wafer sample plates and sample spacers
SmartLab: Automated Multipurpose X-ray Diffractometer 89
Magnets supplied with the product are generally used to secure the sample in
place. For information on how to mount samples, see Wafer-shaped samples
.
Magnets for securing sample in place
The sample holding magnets can be used for samples measuring up to approximately
3 mm in thickness.
The Z axis is used to align the sample surface with the center of the x-ray beam.
Since the thickness range for which the Z axis can be adjusted is 3 mm, you
must select the appropriate sample spacer based on the thickness of the sample
to be measured.
Table Sample spacers
Measurable sample thickness Abbreviation Illustration
0～3 mm
(option: 2680A406)
0-3 mm
3～6 mm
(option: 2680A405)）
3-6 mm
6～9 mm
(option: 2680A404)
6-9 mm
9～12 mm
(option: 2680A403)
9-12 mm
0-3 mm(blue stamped mark)
12～15 mm
(option: 2640A402)
0～3 mm(*1)
12-15 mm
0-3 mm(blue stamped mark)
15 mm～18 mm
(option: 2680A401)
3～6 mm(*1)
15-18 mm
3-6 mm(blue stamped mark)
*1: Sample thickness for using XY-4”
φ
attachment. Refer to the abbreviations in blue.
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