Solartron 1260 - Analyzer

2.1
2
. 1.1
2.1.2
2.1.3
ANALYZER
The
analyzer
correlates
the
input
signals
V1.V2,
and
I at the drive
signal
frequency
to
obtain
the
frequency
response
and
impedance
of
the item
under
test.
From
these
basic
measurement
data
the
instrument
can
compute
many
different
results
in
various
formats:
you
select
the
result
of
your
choice
from
the DISPLAY
menu
Any
scaling
that
may
be
necessary
is
selected
from
the
SCALING
menu:
this
includes
nulling"
normalisation,
and
scaling
by
functions.
Limits
checking
and
sorting
of
the
results
may
be
selected
from
the
LIMITS
and
B
INSORT
menus.
Z
h
:J?%,Z±
SiS data
are St0red
in the
histor
y
flle
(whe:1
this
cabled,
from
the
UAIAOIIFUI
menu)
and may
be
reviewed
with
the
VIEW
FILE
facility.
[ANALYSIS]
Parameters
common
to all
analyzer
inputs.
The
DELAY
and
/
TIME
parameters
are
shown m
Fig
5.3.
Fig
5.3
Measurement
delay
and
integration
time.
J
TIME
Integration
time.
The
period
over
which
the
analyzer
measures
the
input
signals.
The
duration
of
this
period
determines
the
harmonic
and
noise
rejection
ability
of the
analyzer.
Defined
in
seconds,
the
time
is
rounded
up or
down
to cover
a
whole
number
of cycles.
Fig
5.4
shows
how
rejection
increases
with
time.
The
integration
time
can
be
adjusted
automatically,
in
accordance
with
the
amount
of
noise
present
at
the
input
and
the'
statistical
accuracy
required
for
the
measurement
result.
See
Section
2. 1 .
3 .
DELAY
Delays
the start
of
a
measurement
on
the
measure
command.
Typically
used
with
SWEEP.
Allows
the
response
of the
item
under
test
to settle
after
a
change
in
drive.
ALTO/
Auto
integration.
Selects
an
integration
time
in
keeping
with
the
^®J’™’
ence on
a
sheeted
input.
Measurement
continues,
within
the
j
TIME
period,
until
the
standard
deviation
of
the
input
data
reaches
a
target value:
5
fi nUC
1
/ I a /n