EasyManua.ls Logo

Zeiss Crossbeam 340 - Technical Data

Zeiss Crossbeam 340
134 pages
Print Icon
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
PK=aÉëÅêáéíáçå
fåëíêìÅíáçå=j~åì~ä=`êçëëÄÉ~ã=PQM=ÉåMOE`loF =QT=çÑ=N PQ
qÉÅÜåáÅ~ä=Ç~í~
3.5. Technical data
3.5.1. Specifications
Performance
SEM Resolution High resolution configuration
(max.probe current 20 nA)
Optimum Working distance:
0.9 nm at 30 kV (STEM mode)
1.0 nm at 15 kV
1.9 nm at 1 kV
Acceleration voltage Range: 0.02 kV - 30 kV (SEM)
Adjustment: Continuously variable in 10 Volt steps.
Probe Current
SEM
5 pA to 20 nA High resolution option
12 pA to 100 nA High Current option
Magnification Range: 12x – 2.000.000x (SEM)
Adjustment: Continuously variable in either coarse or fine modes.
Auto-Compensation: Magnification is precisely corrected
automatically for changes in working distance or acceleration
voltage.
Electron optics
Electron source Filament: Schottky field emitter.
Alignment: Two stage electromagnetic emitter alignment utilizing emission
imaging mode
Automatic Emitter Run-Up: Safe controlled run-up of the target emitter
conditions
Indicators: Status information in Software to indicate all emitter parameters
Lens control Patented GEMINI I VP electromagnetic/electrostatic objective lens system
(68º conical final-lens) with water cooling for best thermal stability and
reproducibility
Hysteresis Correction: Built-in, for the removal of lens hysteresis

Table of Contents