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Agilent Technologies EMC Series Programmer's Guide

Agilent Technologies EMC Series
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184 Chapter 3
Programming Examples
Making Faster Measurements (multiple measurements)
printf("Could not open a session to GPIB device at address 18!\n");
exit(0);
}
/*Clear the Instrument */
viClear(viESA);
/* go to known instrument state with cleared status byte */
viPrintf(viESA, ":SYST:PRES:TYPE FACT;*RST\n");
/* measure, transfer and calculate power average of multiple traces */
average();
/* convert average power array back to integer array */
for (iLoop = 0; iLoop < iNumPoints; iLoop++) {
dPower = 10.0 * log10( dPwrAvgArray[iLoop]);
iAvgArray[iLoop] = (int) (1000.0 * dPower);
}
/* build ’TRAC:DATA TRACE2,#nyyy’ header and write the result to Trace 2 */
sprintf(cCommand,":TRAC:DATA TRACE2,#%i%i", HeaderLength(iArrayLength)-2,
iArrayLength);
write_binary_trace(cCommand, iAvgArray);
/* enable the trace, local display and return to continuous sweep */
viPrintf(viESA,":TRACE2:MODE VIEW;:DISP:ENAB ON;:INIT:CONT ON\n");
/* Close session */
viClose(viESA);
viClose(defaultRM);
} /***************************** End of Main *******************************/

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Agilent Technologies EMC Series Specifications

General IconGeneral
BrandAgilent Technologies
ModelEMC Series
CategoryMeasuring Instruments
LanguageEnglish

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