EasyManua.ls Logo

Data I/O UniSite-xpi - Page 256

Data I/O UniSite-xpi
413 pages
Print Icon
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
6. Translation Formats
6-18 UniSite-xpi User Manual
LOF Fields The following fields are included in Data I/Os implementation of the
LOF format:
* These fields are already defined as part of the JEDEC standard and will not be defined in
this section.
<STX> * Start of Data (ASCII Ctrl-B, 0x02 hex)
C * Fuse Checksum
K Fuse data, followed by control words and pulse
link cycles
N * Notes Field
QB Number of bits per word
QC Number of control words at the end of each K
field
QF Number of Fuses in Device (# of K fields)
QM Number of macro cells in the data file
QP * Number of Device Package Pins
QS Number of Hex-ASCII words in each K field
and each control word
QV * Maximum Number of Test Vectors
R Signature Analysis (reserved for future use)
SSpDE Checksum
T Signature Analysis (reserved for future use)
V * Test Vectors (reserved for future use)
X * Default Test Conditions (reserved for future
use)
<ETX> * End of Data (ASCII Ctrl-C, 0x03 hex)

Table of Contents