January 2016 Page 3–25
Chapter 3. Applications
3
Trip Positive
Trip Positive
Trip Negative
Trip Negative
Local Positive
Local Positive
L
ocal Negative
Local Negative
F
Internal Line Up
Keying
Square
Wave
G
H
1
0
1
0
Trip Coincidence
Remote Square Wave
Shaded Portion is
Trip Coincidence
Note:
Similar Comparison Occurs
at Terminal H.
a) Normal Internal Fault
Trip Positive
Trip Positive
Trip Negative
Trip Negative
Local Positive
Local Positive
Local Negative
Local Negative
I
Key
F
Internal Line Up
Keying Square Wave is
Steady Trip Negative
G
H
1
0
1
0
Trip Coincidence
Remote Square Wave Shaded Portion is
Trip Coincidence
Note:
Similar Comparison Occurs
at Terminal H.
c) Internal Fault with Outfeed (Comparison at Strong Terminal)
Keying
Square
Wave
Trip Positive
Trip Positive
Trip Negative
Trip Negative
Local Positive
Local Positive
Local Negative
Local Negative
I
Key
F
External Line Up
G
H
1
0
1
0
Trip Coincidence: None
Remote Square Wave
Note:
Similar Comparison Occurs
at Terminal H.
b) External Fault
Note:
Local Square
Waves "Nest" within
Remote Square Wave
to Provide Security
Figure 3–16. Response of Segregated Phase Comparison
System with Offset Keying