3.14 Self-Monitoring (Function Group SFMON) ..................................................................3-91
3.14.1 Tests During Start-up .................................................................................................................................. 3-91
3.14.2 Cyclic Tests ..................................................................................................................................................3-91
3.14.3 Signals .........................................................................................................................................................3-91
3.14.4 Device Response .........................................................................................................................................3-92
3.14.5 Monitoring Signal Memory ...........................................................................................................................3-93
3.14.6 Monitoring Signal Memory Time Tag ...........................................................................................................3-93
3.15 Operating Data Recording (Function Group OP_RC) ................................................. 3-94
3.16 Monitoring Signal Recording (Function Group MT_RC) ..............................................3-95
3.17 Overload Data Acquisition (Function Group OL_DA) ................................................. 3-96
3.17.1 Overload Duration .......................................................................................................................................3-96
3.17.2 Acquiring Measured Overload Data from the Thermal Overload Protection ................................................3-97
3.18 Overload Recording (Function Group OL_RC) ............................................................3-98
3.18.1 Start of Overload Recording ........................................................................................................................3-98
3.18.2 Counting Overload Events ...........................................................................................................................3-98
3.18.3 Time Tagging ...............................................................................................................................................3-98
3.18.4 Overload Logging ........................................................................................................................................ 3-99
3.19 Fault Data Acquisition (Function Group FT_DA) ...................................................... 3-100
3.19.1 Running Time and Fault Duration ..............................................................................................................3-100
3.19.2 Fault Data Acquisition Time .......................................................................................................................3-100
3.19.3 Acquisition of the Fault Currents ............................................................................................................... 3-102
3.19.4 Acquisition of the Differential and Restraining Currents ............................................................................3-102
3.19.5 Fault Data Reset ........................................................................................................................................3-103
3.20 Fault Recording (Function Group FT_RC) ................................................................ 3-104
3.20.1 Start of Fault Recording .............................................................................................................................3-104
3.20.2 Fault Counting ...........................................................................................................................................3-105
3.20.3 Time Tagging .............................................................................................................................................3-105
3.20.4 Fault Recordings ........................................................................................................................................3-106
3.20.5 Fault Value Recording ............................................................................................................................... 3-107
3.21 Differential Protection (Function Group DIFF) ......................................................... 3-109
3.21.1 Enabling or Disabling Differential Protection .............................................................................................3-109
3.21.2 Amplitude Matching ...................................................................................................................................3-110
3.21.3 Vector Group Matching ..............................................................................................................................3-113
3.21.4 Zero-sequence Current Filtering ................................................................................................................3-113
3.21.5 Tripping Characteristics .............................................................................................................................3-115
3.21.6 Rapid (high-set) Differential Protection ..................................................................................................... 3-117
3.21.7 Inrush Stabilization (Harmonic Restraint) ..................................................................................................3-118
3.21.8 Saturation Discriminator ............................................................................................................................3-119
3.21.9 Overfluxing Stabilization ........................................................................................................................... 3-120
3.21.10 Measured Operating Data of Differential Protection ..................................................................................3-121
3.22 Definite-Time Overcurrent Protection (Function Groups DTOC1 and DTOC2) .........3-123
3.22.1 Enabling or Disabling DTOC Protection ......................................................................................................3-123
3.22.2 Phase Current Stages ................................................................................................................................3-124
3.22.3 Negative-Sequence Current Stages ...........................................................................................................3-126
3.22.4 Residual Current Stages ............................................................................................................................3-127
3.22.5 General Starting ........................................................................................................................................3-129
3.22.6 Counters of the DTOC Protection Function ................................................................................................3-130
3.23 Inverse-time Overcurrent Protection (Function Groups IDMT1 and IDMT2) ............ 3-131
3.23.1 Enabling or Disabling IDMT Protection .......................................................................................................3-131
3.23.2 Time-Dependent Characteristics ............................................................................................................... 3-133
3.23.3 Phase Current Stage ..................................................................................................................................3-136
3.23.4 Negative-Sequence Current Stage ............................................................................................................ 3-138
3.23.5 Residual Current Stage ..............................................................................................................................3-140
3.23.6 Hold Time ..................................................................................................................................................3-142
Table of Contents
P631
P631/EN M/R-11-C // P631-310-650 3