Micom P631 - Measurements

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9.10 Measurements

Parameter

Scaling Unit Multiplier

Multiplication factor; not supported.

Parameter

Scaled Measurement

Range

Min

Max

Lower / Upper measuring range limit value; not supported.

Parameter

Deadband

Configuration

Deadband

Multiplier for the smallest display value of the measured value. In order to have

the current measured value sent when it has changed from the value last sent

the result of the set dead band value multiplied by the smallest display value

must exceed the smallest display value.

9 IEC 61850 Settings via IED Configurator

P631

P631/EN M/R-11-C // P631-310-650 9-15

Main Page

Default Chapter9
- Table of Contents9
1 Application and Scope17
- Overview - P63117
- Including Function Groups in the Configuration19
- Overview of Function Groups - Part 120
- Overview of Function Groups - Part 222
- Design24
- Configurable Function Keys25
- Inputs and Outputs26
- Control and Display27
- Information Interfaces28
2 Technical Data29
- Conformity29
- General Data30
- General Device Data30
- Tests32
- Type Tests32
- Routine Tests35
- Environmental Conditions37
- Inputs and Outputs38
- Current Measuring Inputs38
- Binary Signal Inputs39
- IRIG-B Interface40
- Direct Current Input40
- Resistance Thermometer40
- Direct Current Output40
- Output Relays41
- BCD Measured Data Output41
- Interfaces42
- Local Control Panel42
- PC Interface42
- Serial Communication Interface42
- IEC Communication Interface43
- IRIG-B Interface43
- Information Output44
- Settings - Typical Characteristic Data45
- Main Function45
- Differential Protection45
- Definite-Time and Inverse-Time Overcurrent Protection45
- Deviations46
- Deviations of the Operate Values46
- Deviations of the Timer Stages47
- Deviations of Measured Data Acquisition48
- Resolution of the Fault Data Acquisition49
- Time Resolution49
- Currents49
- Voltage49
- Recording Functions50
- Organization of the Recording Memories50
- Power Supply52
- Current Transformer Specifications53
- Symbols53
- General Equations54
- Transformer Differential Protection55
3 Operation57
- Modular Structure57
- Operator-Machine Communication59
- Configuration of the Measured Value Panels (Function Group LOC)60
- Operation Panel61
- Fault Panel62
- Overload Panel63
- Configurable Clear Key63
- Serial Interfaces64
- PC Interface (Function Group PC)65
- Communication Interface 1 (Function Group COMM1)66
- Communication Interface 2 (Function Group COMM2)75
- Communication Interface IEC 61850 (Function Groups IEC, GOOSE and GSSE)77
- IRIG-B Clock Synchronization (Function Group IRIGB)89
- Configurable Function Keys (Function Group F_KEY)90
- Configuration and Operating Mode of the Binary Inputs (Function Group INP)92
- Measured Data Input (Function Group MEASI)94
- Direct Current Input on the Analog (I/O) Module y95
- Input for Connection of a Resistance Thermometer98
- Configuration, Operating Mode, and Blocking of the Output Relays (Function Group OUTP)100
- Measured Data Output (Function Group MEASO)103
- General Settings103
- BCD Measured Data Output105
- Analog Measured Data Output108
- Output of "External" Measured Data114
- Configuration and Operating Mode of the LED Indicators (Function Group LED)115
- Configuring the LED Indicators115
- Layout of the LED Indicators115
- Operating Mode of the LED Indicators116
- Main Functions of the P631 (Function Group MAIN)118
- Conditioning of the Measured Values118
- Phase Reversal Function121
- Operating Data Measurement123
- Configuring and Enabling the Device Functions130
- Activation of "Dynamic Parameters132
- Multiple Blocking133
- Multiple Signaling of the Measuring Circuit Monitoring Function134
- Blocked/Faulty135
- Starting Signals and Tripping Logic135
- Time Tagging and Clock Synchronization138
- Resetting Actions140
- Assigning Communications Interfaces to Physical Communications Channels143
- Test Mode144
- Parameter Subset Selection (Function Group PSS)145
- Self-Monitoring (Function Group SFMON)147
- Tests During Start-Up147
- Cyclic Tests147
- Signals147
- Device Response148
- Monitoring Signal Memory149
- Monitoring Signal Memory Time Tag149
- Operating Data Recording (Function Group OP_RC)150
- Monitoring Signal Recording (Function Group MT_RC)151
- Overload Data Acquisition (Function Group OL_DA)152
- Overload Duration152
- Acquiring Measured Overload Data from the Thermal Overload Protection153
- Overload Recording (Function Group OL_RC)154
- Start of Overload Recording154
- Counting Overload Events154
- Time Tagging154
- Overload Logging155
- Fault Data Acquisition (Function Group FT_DA)156
- Running Time and Fault Duration156
- Fault Data Acquisition Time156
- Acquisition of the Fault Currents158
- Acquisition of the Differential and Restraining Currents158
- Fault Data Reset159
- Fault Recording (Function Group FT_RC)160
- Start of Fault Recording160
- Fault Counting161
- Time Tagging161
- Fault Recordings162
- Fault Value Recording163
- Differential Protection (Function Group DIFF)165
- Enabling or Disabling Differential Protection165
- Amplitude Matching166
- Vector Group Matching169
- Zero-Sequence Current Filtering169
- Tripping Characteristics171
- Rapid (High-Set) Differential Protection173
- Inrush Stabilization (Harmonic Restraint)174
- Saturation Discriminator175
- Overfluxing Stabilization176
- Measured Operating Data of Differential Protection177
- Definite-Time Overcurrent Protection (Function Groups DTOC1 and DTOC2)179
- Enabling or Disabling DTOC Protection179
- Phase Current Stages180
- Negative-Sequence Current Stages182
- Residual Current Stages183
- General Starting185
- Counters of the DTOC Protection Function186
- Inverse-Time Overcurrent Protection (Function Groups IDMT1 and IDMT2)187
- Enabling or Disabling IDMT Protection187
- Time-Dependent Characteristics189
- Phase Current Stage192
- Negative-Sequence Current Stage194
- Residual Current Stage196
- Hold Time198
- General Starting200
- Counters of the IDMT Protection Function200
- Thermal Overload Protection (Function Group THRM1)201
- Enabling or Disabling Thermal Overload Protection201
- Readiness of Thermal Overload Protection202
- Tripping Characteristics202
- Coolant Temperature Acquisition203
- Warning Signal204
- Current Transformer Supervision (Function Group CTS)207
- Hardware Requirement207
- Enabling or Disabling the CTS Function207
- Blocking CTS207
- Monitoring Condition208
- Signaling and Indication209
- Reset210
- Multiple Signaling from the CTS Function210
- Measuring-Circuit Monitoring (Function Groups MCM_1 and MCM_2)212
- Enabling or Disabling Measuring-Circuit Monitoring212
- Measuring-Circuit Monitoring212
- Multiple Signaling from the Measuring-Circuit Monitoring Function213
- Circuit Breaker Failure Protection (Function Groups CBF_1 and CBF_2)214
- Assigning Transformer Ends214
- Assigning Circuit Breakers214
- Assigning the Trip Command214
- Enabling or Disabling the CBF Function214
- Readiness of Circuit Breaker Protection215
- Detecting a CB Tripping216
- Current Flow Monitoring216
- Evaluation of CB Status Signals217
- Startup Criteria218
- Trip Commands220
- Starting Trigger220
- Fault Behind CB Protection221
- CB Synchronization Supervision221
- Limit Value Monitoring (Function Group LIMIT)223
- Enabling or Disabling the Limit Value Monitoring Function223
- Monitoring the Linearized Measured DC Values223
- Monitoring the Measured Temperature Value224
- Limit Value Monitoring (Function Groups LIM_1 and LIM_2)226
- Monitoring Minimum and Maximum Phase Currents226
- Programmable Logic (Function Groups LOGIC and LOG_2)228
4 Design237
- Designs238
- Dimensional Drawings240
- Dimensional Drawings for the 40 te Case240
- Detachable HMI241
- Hardware Modules243
5 Installation and Connection247
- Unpacking and Packing248
- Checking Nominal Data and Design Type249
- Location Requirements250
- Environmental Conditions250
- Mechanical Conditions250
- Electrical Conditions for Auxiliary Voltage of the Power Supply250
- Electromagnetic Conditions250
- Installation251
- Protective and Operational Grounding257
- Connection258
- Connecting Measuring and Auxiliary Circuits258
- Connecting the IRIG-B Interface260
- Connecting the Serial Interfaces260
- Location and Connection Diagrams264
- Location Diagrams P631-409/410264
- Terminal Connection Diagrams P631-409/410264
6 Local Control (Hmi)267
- Local Control Panel (HMI)267
- Display and Keypad268
- Text Display268
- Display Illumination268
- Contrast of the Display268
- Short Description of Keys269
- Display Levels271
- Display Panels272
- Menu Tree and Data Points273
- List Data Points274
- Note Concerning the Step-By-Step Descriptions275
- Configurable Function Keys276
- Configuration of the Function Keys F1 to Fx277
- Changing between Display Levels280
- Control at Panel Level281
- Control at the Menu Tree Level282
- Navigation in the Menu Tree282
- Switching between Address Mode and Plain Text Mode283
- Change-Enabling Function284
- Changing Parameters287
- List Parameters288
- Memory Readout291
- Resetting294
- Password-Protected Control Actions295
- Changing the Password297
7 Settings301
- Parameters301
- Device Identification303
- Configuration Parameters311
- Function Parameters371
8 Information and Control Functions423
- Operation423
- Cyclic Values424
- Control and Testing504
- Operating Data Recording511
- Events515
- Event Counters515
- Measured Event Data518
- Event Recording521
9 Iec 61850 Settings Via Ied Configurator523
- Manage IED524
- IED Details525
- Communications526
- Sntp527
- General Config527
- External Server 1527
- External Server 2527
- Dataset Definitions528
- GOOSE Publishing529
- System/Lln0529
- GOOSE Subscribing531
- Mapped Inputs531
- Report Control Blocks534
- System/Lln0534
- Controls535
- Control Objects535
- Uniqueness of Control535
- Measurements537
- Configurable Data Attributes538
- System/Lln0538
10 Commissioning539
- Safety Instructions539
- Commissioning Tests541
- Preparation541
- Testing543
- Checking the Binary Signal Inputs543
- Checking the Output Relays543
- Checking the Protection Function543
- Completing Commissioning547
11 Troubleshooting549
12 Maintenance561
- Maintenance Procedures in the Power Supply Area562
- Routine Functional Testing563
- Analog Input Circuits564
- Binary Opto Inputs565
- Binary Outputs566
- Serial Interfaces567
13 Storage569
14 Accessories and Spare Parts571
15 Order Information573
A1 Function Groups578
A2 Internal Signals579
- Modules583
- Symbols583
- Examples of Signal Names589
- Symbols Used590
A4 Telecontrol Interfaces591
- A4.1.1591
  - Interoperability591
- A4.2.1599
  - Interoperability599
A5 P631 Version History609

Micom P631 - Measurements

Table of Contents

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