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Additional Thermal Test

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100% controlled thermal endurance test, inputs loaded.

P631

2 Technical Data

2-8 P631/EN M/R-11-C // P631-310-650

Main Page

Default Chapter9
- Table of Contents9
1 Application and Scope17
- Overview - P63117
- Including Function Groups in the Configuration19
- Overview of Function Groups - Part 120
- Overview of Function Groups - Part 222
- Design24
- Configurable Function Keys25
- Inputs and Outputs26
- Control and Display27
- Information Interfaces28
2 Technical Data29
- Conformity29
- General Data30
- General Device Data30
- Tests32
- Type Tests32
- Routine Tests35
- Environmental Conditions37
- Inputs and Outputs38
- Current Measuring Inputs38
- Binary Signal Inputs39
- IRIG-B Interface40
- Direct Current Input40
- Resistance Thermometer40
- Direct Current Output40
- Output Relays41
- BCD Measured Data Output41
- Interfaces42
- Local Control Panel42
- PC Interface42
- Serial Communication Interface42
- IEC Communication Interface43
- IRIG-B Interface43
- Information Output44
- Settings - Typical Characteristic Data45
- Main Function45
- Differential Protection45
- Definite-Time and Inverse-Time Overcurrent Protection45
- Deviations46
- Deviations of the Operate Values46
- Deviations of the Timer Stages47
- Deviations of Measured Data Acquisition48
- Resolution of the Fault Data Acquisition49
- Time Resolution49
- Currents49
- Voltage49
- Recording Functions50
- Organization of the Recording Memories50
- Power Supply52
- Current Transformer Specifications53
- Symbols53
- General Equations54
- Transformer Differential Protection55
3 Operation57
- Modular Structure57
- Operator-Machine Communication59
- Configuration of the Measured Value Panels (Function Group LOC)60
- Operation Panel61
- Fault Panel62
- Overload Panel63
- Configurable Clear Key63
- Serial Interfaces64
- PC Interface (Function Group PC)65
- Communication Interface 1 (Function Group COMM1)66
- Communication Interface 2 (Function Group COMM2)75
- Communication Interface IEC 61850 (Function Groups IEC, GOOSE and GSSE)77
- IRIG-B Clock Synchronization (Function Group IRIGB)89
- Configurable Function Keys (Function Group F_KEY)90
- Configuration and Operating Mode of the Binary Inputs (Function Group INP)92
- Measured Data Input (Function Group MEASI)94
- Direct Current Input on the Analog (I/O) Module y95
- Input for Connection of a Resistance Thermometer98
- Configuration, Operating Mode, and Blocking of the Output Relays (Function Group OUTP)100
- Measured Data Output (Function Group MEASO)103
- General Settings103
- BCD Measured Data Output105
- Analog Measured Data Output108
- Output of "External" Measured Data114
- Configuration and Operating Mode of the LED Indicators (Function Group LED)115
- Configuring the LED Indicators115
- Layout of the LED Indicators115
- Operating Mode of the LED Indicators116
- Main Functions of the P631 (Function Group MAIN)118
- Conditioning of the Measured Values118
- Phase Reversal Function121
- Operating Data Measurement123
- Configuring and Enabling the Device Functions130
- Activation of "Dynamic Parameters132
- Multiple Blocking133
- Multiple Signaling of the Measuring Circuit Monitoring Function134
- Blocked/Faulty135
- Starting Signals and Tripping Logic135
- Time Tagging and Clock Synchronization138
- Resetting Actions140
- Assigning Communications Interfaces to Physical Communications Channels143
- Test Mode144
- Parameter Subset Selection (Function Group PSS)145
- Self-Monitoring (Function Group SFMON)147
- Tests During Start-Up147
- Cyclic Tests147
- Signals147
- Device Response148
- Monitoring Signal Memory149
- Monitoring Signal Memory Time Tag149
- Operating Data Recording (Function Group OP_RC)150
- Monitoring Signal Recording (Function Group MT_RC)151
- Overload Data Acquisition (Function Group OL_DA)152
- Overload Duration152
- Acquiring Measured Overload Data from the Thermal Overload Protection153
- Overload Recording (Function Group OL_RC)154
- Start of Overload Recording154
- Counting Overload Events154
- Time Tagging154
- Overload Logging155
- Fault Data Acquisition (Function Group FT_DA)156
- Running Time and Fault Duration156
- Fault Data Acquisition Time156
- Acquisition of the Fault Currents158
- Acquisition of the Differential and Restraining Currents158
- Fault Data Reset159
- Fault Recording (Function Group FT_RC)160
- Start of Fault Recording160
- Fault Counting161
- Time Tagging161
- Fault Recordings162
- Fault Value Recording163
- Differential Protection (Function Group DIFF)165
- Enabling or Disabling Differential Protection165
- Amplitude Matching166
- Vector Group Matching169
- Zero-Sequence Current Filtering169
- Tripping Characteristics171
- Rapid (High-Set) Differential Protection173
- Inrush Stabilization (Harmonic Restraint)174
- Saturation Discriminator175
- Overfluxing Stabilization176
- Measured Operating Data of Differential Protection177
- Definite-Time Overcurrent Protection (Function Groups DTOC1 and DTOC2)179
- Enabling or Disabling DTOC Protection179
- Phase Current Stages180
- Negative-Sequence Current Stages182
- Residual Current Stages183
- General Starting185
- Counters of the DTOC Protection Function186
- Inverse-Time Overcurrent Protection (Function Groups IDMT1 and IDMT2)187
- Enabling or Disabling IDMT Protection187
- Time-Dependent Characteristics189
- Phase Current Stage192
- Negative-Sequence Current Stage194
- Residual Current Stage196
- Hold Time198
- General Starting200
- Counters of the IDMT Protection Function200
- Thermal Overload Protection (Function Group THRM1)201
- Enabling or Disabling Thermal Overload Protection201
- Readiness of Thermal Overload Protection202
- Tripping Characteristics202
- Coolant Temperature Acquisition203
- Warning Signal204
- Current Transformer Supervision (Function Group CTS)207
- Hardware Requirement207
- Enabling or Disabling the CTS Function207
- Blocking CTS207
- Monitoring Condition208
- Signaling and Indication209
- Reset210
- Multiple Signaling from the CTS Function210
- Measuring-Circuit Monitoring (Function Groups MCM_1 and MCM_2)212
- Enabling or Disabling Measuring-Circuit Monitoring212
- Measuring-Circuit Monitoring212
- Multiple Signaling from the Measuring-Circuit Monitoring Function213
- Circuit Breaker Failure Protection (Function Groups CBF_1 and CBF_2)214
- Assigning Transformer Ends214
- Assigning Circuit Breakers214
- Assigning the Trip Command214
- Enabling or Disabling the CBF Function214
- Readiness of Circuit Breaker Protection215
- Detecting a CB Tripping216
- Current Flow Monitoring216
- Evaluation of CB Status Signals217
- Startup Criteria218
- Trip Commands220
- Starting Trigger220
- Fault Behind CB Protection221
- CB Synchronization Supervision221
- Limit Value Monitoring (Function Group LIMIT)223
- Enabling or Disabling the Limit Value Monitoring Function223
- Monitoring the Linearized Measured DC Values223
- Monitoring the Measured Temperature Value224
- Limit Value Monitoring (Function Groups LIM_1 and LIM_2)226
- Monitoring Minimum and Maximum Phase Currents226
- Programmable Logic (Function Groups LOGIC and LOG_2)228
4 Design237
- Designs238
- Dimensional Drawings240
- Dimensional Drawings for the 40 te Case240
- Detachable HMI241
- Hardware Modules243
5 Installation and Connection247
- Unpacking and Packing248
- Checking Nominal Data and Design Type249
- Location Requirements250
- Environmental Conditions250
- Mechanical Conditions250
- Electrical Conditions for Auxiliary Voltage of the Power Supply250
- Electromagnetic Conditions250
- Installation251
- Protective and Operational Grounding257
- Connection258
- Connecting Measuring and Auxiliary Circuits258
- Connecting the IRIG-B Interface260
- Connecting the Serial Interfaces260
- Location and Connection Diagrams264
- Location Diagrams P631-409/410264
- Terminal Connection Diagrams P631-409/410264
6 Local Control (Hmi)267
- Local Control Panel (HMI)267
- Display and Keypad268
- Text Display268
- Display Illumination268
- Contrast of the Display268
- Short Description of Keys269
- Display Levels271
- Display Panels272
- Menu Tree and Data Points273
- List Data Points274
- Note Concerning the Step-By-Step Descriptions275
- Configurable Function Keys276
- Configuration of the Function Keys F1 to Fx277
- Changing between Display Levels280
- Control at Panel Level281
- Control at the Menu Tree Level282
- Navigation in the Menu Tree282
- Switching between Address Mode and Plain Text Mode283
- Change-Enabling Function284
- Changing Parameters287
- List Parameters288
- Memory Readout291
- Resetting294
- Password-Protected Control Actions295
- Changing the Password297
7 Settings301
- Parameters301
- Device Identification303
- Configuration Parameters311
- Function Parameters371
8 Information and Control Functions423
- Operation423
- Cyclic Values424
- Control and Testing504
- Operating Data Recording511
- Events515
- Event Counters515
- Measured Event Data518
- Event Recording521
9 Iec 61850 Settings Via Ied Configurator523
- Manage IED524
- IED Details525
- Communications526
- Sntp527
- General Config527
- External Server 1527
- External Server 2527
- Dataset Definitions528
- GOOSE Publishing529
- System/Lln0529
- GOOSE Subscribing531
- Mapped Inputs531
- Report Control Blocks534
- System/Lln0534
- Controls535
- Control Objects535
- Uniqueness of Control535
- Measurements537
- Configurable Data Attributes538
- System/Lln0538
10 Commissioning539
- Safety Instructions539
- Commissioning Tests541
- Preparation541
- Testing543
- Checking the Binary Signal Inputs543
- Checking the Output Relays543
- Checking the Protection Function543
- Completing Commissioning547
11 Troubleshooting549
12 Maintenance561
- Maintenance Procedures in the Power Supply Area562
- Routine Functional Testing563
- Analog Input Circuits564
- Binary Opto Inputs565
- Binary Outputs566
- Serial Interfaces567
13 Storage569
14 Accessories and Spare Parts571
15 Order Information573
A1 Function Groups578
A2 Internal Signals579
- Modules583
- Symbols583
- Examples of Signal Names589
- Symbols Used590
A4 Telecontrol Interfaces591
- A4.1.1591
  - Interoperability591
- A4.2.1599
  - Interoperability599
A5 P631 Version History609

Micom P631 - Page 36

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