SERVICE CALL CONDITIONS 20 June 2005
4-6
ID sensor, pattern edge detect error 352 D
The ID sensor pattern edge voltage is
detected to be not 2.5V twice
consecutively during an 800 ms
interval.
• ID sensor defective
• ID sensor connector defective
• Poor ID sensor connector connection
• I/O board (IOB) defective
• High voltage supply board defective
• Dirty ID sensor
• Defect at the ID sensor pattern
writing area of the drum
ID sensor, LED current abnormal at
initialization
353 D
One of the following ID sensor output
voltages is detected at ID sensor
initialization.
1) Vsg < 4.0V when the maximum
PWM input (255) is applied to the
ID sensor.
2) Vsg ≥ 4.0V when the minimum
PWM input (0) is applied to the ID
sensor.
• ID sensor defective
• ID sensor harness defective
• ID sensor connector defective
• Poor ID sensor connection
• I/O board (IOB) defective
• Exposure system defective
• High voltage supply board defective
• Dirty ID sensor
ID sensor timeout abnormal at
adjustment
354 D
Vsg falls out of the adjustment target
(4.0 ± 0.2V) at the start of Vsg checking
after 20 seconds
• ID sensor defective
• ID sensor harness defective
• ID sensor connector defective
• I/O board (IOB) defective
• Exposure system defective
• Poor ID sensor connector connection
• High voltage supply board defective
• Dirty ID sensor
TD sensor error: Test value abnormal 390 D
The TD sensor output voltage is less
than 0.5V or more than 5.0V after 10
consecutive times during copying.
• TD sensor defective
• TD sensor not connected or
connector damaged
• Poor connection between the TD
sensor and the I/O board (IOB)
• I/O board (IOB) defective
• Toner supply defective
TD sensor error: Auto adjust error 391 D
During automatic adjustment of the TD
sensor, output voltage is less than 1.8V
or more than 4.8V during TD sensor
initial setting.
• TD sensor abnormal
• TD sensor disconnected
• Poor TD sensor connection
• I/O board (IOB) defective
• Toner supply defective
Development output abnormal 395 D
A development bias leak signal is
detected. High voltage output to the
development unit exceeded the upper
limit (65%) for 60 ms.
• High voltage supply board defective
• Poor connection at the development
bias terminal
• Poor connection at the high voltage
supply board
Transfer roller leak detected 401 D
A transfer roller current leak signal is
detected.
• High voltage supply board defective
• Poor cable connection or defective
cable
• Transfer connector defective