Basic Instrument Functions
R&S
®
CMW500
92User Manual 1173.9463.02 ─ 06
The result of each test ("State") is displayed in the individual test section:
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Invalid: No test performed yet, no result available
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In progress: Test running, no result available yet
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Passed: Test passed, all measurements within the factory-set tolerances
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Failed: Test failed, one or more measurements out of tolerances
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Skipped: Test skipped because it could not be performed with the current instrument
configuration (this happens e.g. if you try to initiate an OXCO test while "Frequency
Source: External" is active).
TCXO / OCXO selftest
To perform a selftest on the Temperature Controlled Crystal Oscillator (TCXO) or on the
optional oven quartz (Timebase OCXO, option R&S CMW-B690A), you have to switch
the R&S CMW500 to internal reference frequency source, see chapter 4.4.6, "Sync Set-
tings", on page 97.
This ensures that the oscillators are power-supplied.
4.4.5.2 Board Tests
A board test verifies that a particular hardware module works properly. Depending on the
board, the R&S CMW500 may provide different types of board tests described below.
Diagnosis Test
The R&S CMW500 measures a series of selectable diagnostic voltages and checks
whether they are within the permitted range. The permitted minimum and maximum vol-
tages are stored in the EEprom of the tested board.
A diagnoses test is provided for most of the R&S CMW500 modules.
RAM Test
The R&S CMW500 tests one or more of the memories (SRAM, SSRAM, ASRAM, DDR)
on the board. Two different types of memory tests are provided.
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For an Address Line Test, the individual address lines of the RAM are activated one
after another in order to transfer a definite number to the RAM. If the instrument can
read the transferred and stored numbers correctly after testing all address lines, the
address lines must be independent (not interconnected), as required.
Setup Dialog
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