OPERATION
Axio Vert.A1
Illumination and Contrast Techniques in Reflected Light Carl Zeiss
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4.12.2 Reflected Light Dark Field
The reflected light dark field technique is used when not entirely reflecting surfaces with differences in
reflectivity (ideal bright field objects) are examined, but scratches, cracks and pores exist - in short, when
there are deviations from plane surfaces. All the light-scattering details will light up brightly in the dark
field, while reflecting plane surfaces will remain dark.
Requirements
− The microscope must have properly been put into operation, as described in Section 3.
− The microscope must be switched on.
− VIS-LED or HAL 100 reflected light illumination
− Objectives for dark field (designation: HD)
− P&C dark field module
Setting Dark Field
• Rotate in the dark field objective on the nosepiece.
• Open the luminous field and aperture diaphragms completely and switch off or remove the neutral-
density filter, as appropriate.
• Put on the specimen and focus.
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