Setup and Testing Go to Contents
HFA3 Instructions for Use 2660021166131 Rev. A 2018-11
4-22
Create Custom Test Patterns
To create a custom pattern:
1. Go to Se
ttings > Specific Settings > Custom Test Patterns.
You should see a list of patterns if any exist.
2. To view a pattern, highlight it and select Vie
w. To create a new
pattern, select Create Static Test Pattern
or
Create Kinetic Test
Pattern.
Note: A
custom Static Test Pattern can be used as either a Threshold
or Suprathreshold test.
Note: The SIT
A test strategy cannot be used in a custom test.
Create Static Test Pattern
After Cr
eate Static Test Pattern is chosen, a message displays stating that the pattern created will
specify the right eye (OD). A mirror image of the pattern will be created for the left eye (OS).Select
OK.
The next screen displays the following features:
• Te
st Field - Create test points by directly touching or clicking on the test field. X, Y values are
displayed to the right.
• T
est Pattern - Select either Single or Grid to create single points or a grid pattern, respectively.
Single points can be added to a Grid Point Pattern and a grid of points can be added to a
Single Point Pattern. A test pattern can hold a maximum of 248 points.
• Field Si
ze - Changes the field view display. This has no effect on the pattern itself, but point
placement is easier in the central portions of the field of view by selecting 10 degrees (10°) or
30 degrees (30°). 90 degrees (90°) displays the entire field in degrees.
• P
oint Spacing - This option is only available when the Grid test pattern is selected and is the
distance allowed between points (Two, Four, Six, Eight, Ten, Twelve degrees).
• D
elete Point - Touch or click on a point to highlight it (the point will turn blue) and delete by
selecting Delete Point.
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