1-2
Making Measurements
Using This Chapter
Using This Chapter
This chapter contains the following example procedures for making measurements. Mixer and time domain
measurements are covered in
Chapter 2 , "Making Mixer Measurements" and Chapter 3 , “Making Time
Domain Measurements.” This chapter also describes how to use most display, marker, and sequencing
functions.
• "Making a Basic Measurement" on page 1-4
• "Measuring Magnitude and Insertion Phase Response" on page 1-7
• "Measuring Electrical Length and Phase Distortion" on page 1-43
— Electrical Length
— Phase Distortion (deviation from linear phase, group delay)
• Characterizing a Duplexer (ES Analyzers Only)
• "Measuring Amplifiers" on page 1-52
— Measuring Harmonics (Option 002 Only)
— Measuring Gain Compression
— Measuring Gain Compression and Reverse Isolation Simultaneously
(ES Analyzers Only)
— Making High Power Measurements (ES Analyzers Only)
• "Using the Swept List Mode to Test a Device" on page 1-69
• "Using Limit Lines to Test a Device" on page 1-74
• "Using Test Sequencing to Test a Device" on page 1-115
• "Single Connection Multiple Measurement Configuration (Option 014 Only)" on page 1-121
The following chapters describe how to use more instrument functions (as indicated by their chapter titles):
• Chapter 4 , "Printing, Plotting, and Saving Measurement Results"
• Chapter 5 , "Optimizing Measurement Results"
• Chapter 6 , "Calibrating for Increased Measurement Accuracy"
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