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Making Measurements
Using the Swept List Mode to Test a Device
Using the Swept List Mode to Test a Device
When using a list frequency sweep, the analyzer has the ability to sweep arbitrary frequency segments,
each containing a list of frequency points. One major advantage of using list frequency sweep is that it
allows you to measure the minimum number of data points, and only at the frequencies of interest. This
serves to minimize the overall test time. Two different list frequency sweep modes can be selected:
Stepped List
Mode In this mode, the source steps to each defined frequency point, stopping while data is
taken. This mode eliminates IF delay and allows frequency segments to overlap.
However, the sweep time is substantially slower than for a continuous sweep with the
same number of points.
Swept List
Mode This mode takes data while sweeping through the defined frequency segments,
increasing throughput by up to 6 times over a stepped sweep. In addition, this mode
allows the test port power and IF bandwidth to be set independently for each segment
that is defined. The frequency segments in this mode cannot overlap.
The ability to completely customize the frequency sweep while using swept list mode is useful when setting
up a measurement for a device with high dynamic range, like a filter. The following measurement of a filter
illustrates the advantages of using the swept list mode.
• For in-depth information on swept list mode, refer to "Swept List Frequency Sweep (Hz)" on page 7-18.
• For information on optimizing your measurement results when using swept list mode, refer to "To Use
Swept List Mode" on page 5-9.
Connect the Device Under Test
1. Connect the equipment as shown in Figure 1-56.
Figure 1-56 Swept List Measurement Setup
2. Set the following measurement parameters:
or on ET models:
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