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Making Measurements
Using Limit Lines to Test a Device
Using Limit Lines to Test a Device
Limit testing is a measurement technique that compares measurement data to constraints that you define.
Depending on the results of this comparison, the analyzer will indicate if your device either passes or fails
the test.
Limit testing is implemented by creating individual flat, sloping, and single-point limit lines on the analyzer
display. When combined, these lines can represent the performance parameters for your device under test.
The limit lines created on each measurement channel are independent of each other.
This example measurement shows you how to test a bandpass filter using the following procedures:
• creating flat limit lines
• creating sloping limit lines
• creating single point limit lines
• editing limit segments
• running a limit test
Setting Up the Measurement Parameters
1. Connect your test device as shown in Figure 1-60.
Figure 1-60 Connections for SAW Filter Example Measurement
2. Press and choose the measurement settings. For this example the measurement settings are
as follows:
• or on ET models:
•
•
•
You may also want to select settings for the number of data points, power, averaging, and IF bandwidth.
3. Substitute a thru for the device and perform a response calibration by pressing:
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