Index-10
Index
understanding, 7-21
S-parameters menu
input ports menu, 7-24
specific amplitude, 1-40
bandwidth, searching for, 1-42
maximum amplitude, searching for,
1-40
minimum amplitude, searching for,
1-40
target amplitude, searching for, 1-41
tracking the amplitude, 1-42
spreadsheet, saving test file for a, 4-42
spur avoidance, understanding, 5-18
spurious responses, reducing the effect
of
, 2-5
standards, calibration, 6-5
start frequency, setting, 1-35
starting the ripple test, 1-90
statistics of measurement data,
calculating
, 1-43
stepped edit list menu, 7-17
stepped edit subsweep menu, 7-17
stepped list frequency sweep, 7-16
segment menu, 7-17
stepped edit list menu, 7-17
stepped edit subsweep menu, 7-17
stepped list mode, 1-71
stimulus state, error-correction, 6-9
stop frequencies, minimum allowable,
3-16
stop frequency, setting, 1-36
stopping a sequence, 1-103
stopping the ripple test, 1-90
storing
exit HPGL mode and form feed
sequence, 4-24
HPGL initialization sequence, 4-23
sequence on a disk, 1-106
sweep
rate, decreasing, 5-8
speed, increasing, 5-9
type, setting, 5-11
sweep time, 7-12
auto sweep time mode, 7-12
manual sweep time mode, 7-12
minimum sweep time, 7-12
sweep types, 7-16
CW time sweep, 7-20
linear frequency sweep, 7-16
logarithmic frequency sweep, 7-16
power sweep, 7-20
selecting sweep modes, 7-20
stepped list frequency sweep, 7-16
swept list frequency sweep, 7-18
sweep-to-sweep averaging, 7-7
swept edit list menu, 7-18
swept edit subsweep menu, 7-18
swept list frequency sweep, 7-18
setting segment IF bandwidth, 7-19
setting segment power, 7-19
swept edit list menu, 7-18
swept edit subsweep menu, 7-18
swept list mode
calibrate, 1-74
characteristics of the filter, 1-72
device under test, connect, 1-71
measure, 1-74
measurement parameters, 1-72
stepped list mode, 1-71
to test a device, 1-71
swept list mode, using, 5-9
swept RF/IF conversion loss, high
dynamic range
, 2-20
switch protection, source attenuator,
7-14
SWR format, 7-31
SWR/return loss, 2-49
synthesized source, built-in, 7-4
system
bandwidth, changing, 5-15
bandwidth, widening, 5-11
parameters, 5-17
system controller mode, 7-80
system operation, 7-3
built-in synthesized source, 7-4
built-in test set, 7-4
microprocessor, 7-5
receiver block, 7-4
required peripheral equipment, 7-5
systematic errors, 7-43
T
taking care of microwave connectors,
5-3
talker/listener mode, 7-80
target amplitude, searching for, 1-41
temperature drift, 5-5
terminology, TRL, 7-69
test
bandwidth, 1-95–1-100
ripple limit, 1-85–1-94
test port coupling, 7-11
test port input power, increasing, 5-14
test sequencing, 1-101
changing the sequence title, 1-105
clearing a sequence from memory,
1-105
creating a sequence, 1-101
editing a sequence, 1-103
generating files in a loop counter
example
, 1-118
in-depth sequencing information,
1-108
inserting a command, 1-104
limit test example sequence, 1-120
loading a sequence from a disk, 1-107
loop counter example sequence,
1-117
modifying a command, 1-104
naming files generated by a sequence,
1-106
printing a sequence, 1-107
purging a sequence from a disk, 1-107
running a sequence, 1-103
stopping a sequence, 1-103
storing a sequence on a disk, 1-106
using to test a device, 1-116
test set, built-in, 7-4
text file, saving measurements as a,
4-42
thru, manual, 6-60
time delay, decreasing, 5-8
time domain bandpass mode, 3-4, 3-12
adjusting the relative velocity factor,
3-12
reflection measurements using
bandpass mode
, 3-12
transmission measurements using
bandpass mode
, 3-14
time domain low pass impulse mode,
3-4
time domain low pass mode, 3-15
fault location measurements using
low pass, 3-18
minimum allowable stop frequencies,
3-16
reflection measurements in time
domain low pass
, 3-16
setting frequency range for time
domain low pass, 3-15
transmission measurements in time
domain low pass
, 3-19
time domain low pass step mode, 3-4
time domain measurements,
introduction
, 3-3
forward transform mode, 3-4
time domain bandpass mode, 3-4
time domain low pass impulse mode,
3-4
time domain low pass step mode, 3-4
time stamp, 4-31
title, 1-108
title, display, 1-11
titling the displayed measurement, 4-30
to produce a time stamp, 4-31
trace math operation, 7-8
trace noise, reducing, 5-15
tracking, 7-42
tracking the amplitude, 1-42
tracking, amplitude and phase, 2-38
transform, 7-9
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