EasyManua.ls Logo

MICRO-EPSILON ILD 1420-10 - Angle Influences

Default Icon
122 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
Page 25
Installation
optoNCDT 1420
5.1.2.7 Angle Influences
Tilt angles of the target in diffuse reflection both around the X and the Y axis of less than 5 ° only have a
disturbing effect with surfaces which are highly reflecting.
These influences have to be explicitly considered when scanning profiled surfaces. Basically the angle be-
havior of triangulation is liable to the reflectivity of the measuring object surface.
Angle
X-axise
Y-axis
Fig. 9 Measurement errors through tilting with diffuse reflection

Table of Contents