Omron ZFX-C

Setting Measurement Items
ZFX-C User’s Manual
3
SETTING THE MEASUREMENT CONDITIONS
95
Defect
Use this item to detect dirt, scratching, chipping, burrs, and other defects on plain measurement targets. The
extent of the defects at locations having the highest number of defects and their positions are output. The
number of locations where the extent of defects equals or exceeds the noise level also are output.
Number of Defects
Setup
Measurement
The measurement region is automatically subdivided into
smaller sections to detect for changes in their respective
brightness (density). The density difference with the surround-
ing area is collected, parts having a large difference are
judged to be a defect, and the position information and extent
of the defects of the locations having the highest number of
defects are output.
Measurement region
Subdivision
Scratch
Chipping and burrs on the outer periphery also can be detected.
Burr
Chipping
Note
The extent of the defects is calculated in subdivided
regions, and regions at or exceeding the defect
threshold are output as the number of defects.