OSSD SAFETY OUTPUTS
Important note concerning OSSD Safety Outputs
➔
OSSD safety outputs are periodically tested against possible stucks to 0V or +24VDC or against
bad cabling (e.g. two OSSD outputs shorted together). The test method chosen to perform this
safety check is the “voltage dip” test: periodically (every: MOSAIC M1: 20 ms; MOSAIC M1S and
MOSAIC M1S COM: 600 ms) and for a very short time (< 120 µs) each OSSD output is forced to
0VDC and if the test results are not consistent the system goes in fail and into a safe state.
Figure 12 – Voltage dip test
OSSD (MOSAIC M1, MI8O2, MO2, MO4)
The MOSAIC M1, MI8O2, MO2, MO4 modules are equipped with OSSD (static semiconductor
safety outputs) dual channel. These outputs are short circuit protected, cross circuit
monitored and supply:
• In the ON condition: (Uv-0,75V)...Uv (24VDC ± 20%)
• In the OFF condition: 0V...2V r.m.s.
The maximum load of 400mA@24V corresponds to a minimum resistive load of 60.
The maximum capacitive load is 0.68 F. The maximum inductive load is 2 mH.
➔
External devices cannot be connected to the outputs unless explicitly planned in the MSD
program configuration.
OSSD (MOSAIC M1S, MOSAIC M1S COM, MI8O4, MO4L)
The MOSAIC M1S, MOSAIC M1S COM, MI8O4, MO4L modules are equipped with OSSD (static
semiconductor safety outputs) single channel. These outputs are short circuit protected, cross
circuit monitored and supply:
• In the ON condition: (Uv-0,75V)...Uv (24VDC ± 20%)
• In the OFF condition: 0V...2V r.m.s.
The maximum load of 400mA@24V corresponds to a minimum resistive load of 60.
The maximum capacitive load is 0.82F. The maximum inductive load is 2 mH.
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