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SICK nanoScan3 I/O

SICK nanoScan3 I/O
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nanoScan3 Core I/O nanoScan3 Pro I/O
Response time ≥ 70 ms, details: see "R
esponse times", page 116
Scan cycle time 30 ms
Generally necessary protec‐
tive field supplement (TZ =
tolerance range of the safety
laser scanner)
65 mm
Additional supplement Z
R
for
reflection-based measure‐
ment errors
350 mm
Deviation from ideal flatness
of sc
an field at 3 m
≤ ± 75 mm
Multiple sampling 2 … 16
Table 30: Safety-related parameters
nanoScan3 Core I/O nanoScan3 Pro I/O
Type Type 3 (IEC 61496)
Safety integrity level SIL 2 (IEC 61508)
SIL claim limit SILCL 2 (IEC 62061)
Category Category 3 (ISO 13849-1)
Performance level PL d (ISO 13849-1)
PFH
D
(me
an probability of a
dangerous failure per hour)
8 × 10
-8
T
M
(mis
sion time) 20 years (ISO 13849-1)
Safe status when a fault
oc
curs
At least one OSSD is in the OFF state.
Table 31: Interfaces
nanoScan3 Core I/O nanoScan3 Pro I/O
OSSD pairs 1 ≤ 2
Automatic restart of OSSDs
af
ter
2 s to 60 s (configurable)
Length of cable ≤ 30 m ≤ 20 m
Configuration and diagnostic interface
Connection type USB 2.0 Micro-B (female connector)
Transmission rate ≤ 12 Mbit/s (Full Speed) ≤ 12 Mbit/s (Full Speed)
Length of cable ≤ 3 m
Table 32: Electrical data
nanoScan3 Core I/O nanoScan3 Pro I/O
Operating data
Protection class III (IEC 61140)
Supply voltage U
V
24 V DC (16.8 V to 30 V DC) (SELV/PELV)
1)
Residual ripple ± 5%
2)
Start-up current at 24 V ≤ 1.3 A
Current consumption at 24 V
No output load Typ. 0.16 A
With maximum output load Typ. 0.66 A
13 TECHNICAL DATA
112
O P E R A T I N G I N S T R U C T I O N S | nanoScan3 I/O 8024596/15VP/2019-11-15 | SICK
Subject to change without notice

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