Tektronix VM Series User Manual

Glossary
Glossary- 6
TDS5000 Series User Manual
Linear interpolation calculates record points in a straight-line fit between the
actual values acquired. Sin(x)/x computes record points in a curve fit
between the actual values acquired. It assumes all the interpolated points fall
in their appropriate point in time on that curve.
Live waveforms
Waveforms that can update as the acquisition system updates them. Channel
waveforms are live waveforms; reference waveforms are not. Math
waveforms are live if they contain live waveforms in their expressions: Ch1
+ Ref1 defines a live math waveform; Ref1 + Ref2 does not.
Logic state trigger
The oscilloscope checks for defined combinatorial logic conditions on
channels 1, 2, and 3 on a transition of channel 4 that meets the set slope and
threshold conditions. If the conditions of channels 1, 2, and 3 are met then
the oscilloscope triggers.
Logic pattern trigger
The oscilloscope trigger s depending on the combinatoria l logic condition of
channe ls 1, 2, 3, and 4. Allowable conditions ar e AND, OR, NAND, and NOR.
Low
The value used as 0% in automated measurements (whenever High Ref, Mid
Ref, and Low Ref values are needed as in fall time and rise time measure-
ments). May be calculated using either the min/max or the histogram
method. With the min/max method (most useful for general waveforms), it is
the minimum value found. With the histogram method (most useful for
pulses), it refers to the most common value found below the mid point.
Maximum
Amplitude (voltage) measurement of the maximum amplitude. Typically the
most positive peak voltage.
Mean
Amplitude (voltage) measurement of the arithmetic mean over the entire
waveform.
Measurement
An automated numeric readout that the oscilloscope provides directly from
the displayed trace in real time, without operator intervention.
Measurement statistics
The accumulation of a history of individual measurement readouts, showing
the mean and standard deviation of a selected number of samples.
Measurement tracking
The process of automatically adjusting the measurement parameters to reflect
changes in the trace.

Tektronix VM Series Specifications

General

Brand	Tektronix
Model	VM Series
Category	Test Equipment
Language	English