Tektronix VM Series User Manual

Index
Index- 16
TDS5000 Series User Manual
Signal Processing Features, A --2
Sin(x)/x command, D--6
Sin(x)/x interpolation, 3--34, 3--108, 3--109, Glossary--6
SINGLE button, 3--22, 3--26, 3--61
Single sequence triggering, and acquisition mode, 3 -- 61
single--shot sampling, 3--32
site considerations, 1-- 6
Slew rate trigger, Glossary--10
slope
defined, Glossary--10
trigger, 3--53
SLOPE button, 3--53
SLOPE controls, 3--54
Snapshot
copying data, 3--204
exporting, 3--199
Snapshot command, D--7
Snapshot measurements, 3 --122
Software installation, 1--10
SOURCE controls, 3--54
span, defined, 3-- 154
Speci fications, A--1, D--10
certifications and compliance s, A--21
channel input and vertical, A--5
conditions for, A--1
data storage , A--18
display, A-- 16
environmental, A--20
horizontal and acquisition system, A-- 11
input/output port , A--17
mechanical, A--19
power source, A--19
trigger, A-- 13
Spectral Analysis Setup control window, 3--176
spectral analyzer
control locks, 3--152
phase reference position, 3--158
phase unwrap, 3--158
spectral analyzer controls, 3--152
frequency, 3--152, 3--154
gating, 3--152, 3--153
magnitude, 3--152, 3--157
dB, 3--157
dBm, 3--157
linear, 3-- 157
reference level, 3--157
phase, 3--152, 3--158
time, 3-- 152
duration, 3--152
resolution, 3--152
spectral averaging, 3--151
Spect ral Controls, D--9
Spectral Grading color palette, 3 -- 107
Spect ral Grading command, D--6
spectral magnitude dat a, displaying, 3--151
Spectral Math
3dBBWinbins,3--162
acquisition mode, 3-- 172
aliasing, 3--172
averaging, 3--172
Blackman-Harris, 3--160, 3--162
Blackman-Harris window, 3--167
center frequency, 3--155, 3--180
coefficients, 3-- 163
coherent gain, 3--162
dB scale, 3--175, 3--178
dBm, 3--157
dBm sca le, 3--175, 3--178
Defining A Spectral Math Waveform, 3--175, 3--176
Defining Spect ral Math Waveforms, 3--151
Definition of gate parameters, illustrated, 3-- 154
duration, 3--181
Duration and resolution control effects, illustrated,
3--153
Effects of adjusting the reference level offset control ,
illustrated, 3 -- 158
Effects of adjusting the reference level, illustrated,
3--157
Effects of frequency domain control adjustments,
illustrated, 3 -- 156
Effects of trigger jitter, 3--171
Example of scallop loss for a Hanning Window
without zero fill, illustrated, 3 -- 163
Example of the effects of setting the Phase Suppres-
sion Threshold, illustrated, 3-- 159
Flattop2 window, 3--160, 3--162, 3--169
frequency range, 3--180
gate controls, 3--153
gate duration, 3--181
gate position, 3--181
Gaussian window, 3--160, 3 --162, 3--164
group delay, 3--159
Hamming window, 3--160, 3--161, 3--166
Hanning window, 3--160, 3--161, 3--167
How aliased frequencies appear in a spectral
waveform, illustrated, 3-- 173
impulse response testing, 3--160
Kaiser-Bessel window, 3--160, 3--161, 3--167
linear scale, 3--175, 3--178
nearest side lobe, 3--163
phase reference point, 3--181
phase reference position, 3--158
phase unwrap, 3--158
real and imaginary magnitudes, 3--158
Recognizing Aliasing, 3--172

Tektronix VM Series Specifications

General

Brand	Tektronix
Model	VM Series
Category	Test Equipment
Language	English