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Agilent Technologies 7890 Series - FID Fails Leakage Current Test; Possible Causes; Procedure

Agilent Technologies 7890 Series
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26 Agilent 7890 Series Troubleshooting
2 ALS and Detector Symptoms
FID Fails Leakage Current Test
Possible causes
A failed leakage current test usually indicates misassembly,
contamination, or a damaged part.
Procedure
1 If you have just performed maintenance on the FID, first
verify that the detector was reassembled properly before
troubleshooting detector problems.
2 Replace the PTFE (FID) for contamination.
3 Make sure that the interconnect spring is not damaged, bent,
or dirty. The interconnect spring should be touching the
bottom of the collector. If the inteconnect spring is damaged,
bent, or dirty, call Agilent for service.
FID interconnect
spring

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