1-8 Issue 01, 04/2005 Krautkramer USM 35X
Introduction The USM 35X family
1.3 The USM 35X family
The USM 35X is a lightweight and compact ultrasonic
flaw detector especially suitable for
• locating and evaluating material defects,
• measuring wall thicknesses,
• saving and documenting test results.
With its frequency range from 0.5 to 20 MHz and a
maximum calibration range of 10 m (steel), the USM 35X
is designed for use on large workpieces and in high-
resolution measurements.
The different instrument versions
The USM 35X is available in several versions which are
desgined for different applications:
• USM 35X
Standard version for universal ultrasonic test applica-
tions.
• USM 35X DAC
The multiple DAC curves and time-corrected gain
enable a field-oriented echo amplitude evaluation
according to almost all international test specifica-
tions.
• USM 35X S
DGS evaluation mode in addition to multiple DAC
curves and TCG.
DGS curves are stored for all narrow-band single-
element probes; amplitude evaluation is carried out
either in dB above DAC curve or equivalent reflector
size (ERS).
• Data Logger option
This option is available for all USM 35X versions and
is used for the recording and documentation of thick-
ness readings.
1-8 Issue 01, 04/2005 Krautkramer USM 35X
Introduction The USM 35X family
1.3 The USM 35X family
The USM 35X is a lightweight and compact ultrasonic
flaw detector especially suitable for
• locating and evaluating material defects,
• measuring wall thicknesses,
• saving and documenting test results.
With its frequency range from 0.5 to 20 MHz and a
maximum calibration range of 10 m (steel), the USM 35X
is designed for use on large workpieces and in high-
resolution measurements.
The different instrument versions
The USM 35X is available in several versions which are
desgined for different applications:
• USM 35X
Standard version for universal ultrasonic test applica-
tions.
• USM 35X DAC
The multiple DAC curves and time-corrected gain
enable a field-oriented echo amplitude evaluation
according to almost all international test specifica-
tions.
• USM 35X S
DGS evaluation mode in addition to multiple DAC
curves and TCG.
DGS curves are stored for all narrow-band single-
element probes; amplitude evaluation is carried out
either in dB above DAC curve or equivalent reflector
size (ERS).
• Data Logger option
This option is available for all USM 35X versions and
is used for the recording and documentation of thick-
ness readings.