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GE Krautkramer USM 35X - TOF (Selecting the Measuring Point)

GE Krautkramer USM 35X
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5-44 Issue 01, 04/2005 Krautkramer USM 35X
Operation
TOF (Selecting the measuring point)
The sound path measurement in the calibration process
or in the subsequent echo evaluation process depends
on the selected measuring point which can be adjusted
either to flank, to peak or to jflank in the USM 35X.
The point of amplitude measurement is marked by a
small upward triangle on the corresponding gate bar.
The point of distance measurement is marked by a
small downward triangle.
H Note:
While DAC, TCG or JISDAC is active you can change
the TOF mode from peak to flank.
When adjusted to flank or jflank the sound path mea-
surement is made at the point of intersection of the
monitor gate with the rising flank of the
highest
echo in
the gate.
measured soundpath: 19,44 mm
amplitude: 94 %
A Attention:
The highest echo in the gate does not have to be the
echo for which the sound path has been measured. This
may lead to false echo evaluation!
Configuring the USM 35X for a test application
5-44 Issue 01, 04/2005 Krautkramer USM 35X
Operation
TOF (Selecting the measuring point)
The sound path measurement in the calibration process
or in the subsequent echo evaluation process depends
on the selected measuring point which can be adjusted
either to flank, to peak or to jflank in the USM 35X.
The point of amplitude measurement is marked by a
small upward triangle on the corresponding gate bar.
The point of distance measurement is marked by a
small downward triangle.
H Note:
While DAC, TCG or JISDAC is active you can change
the TOF mode from peak to flank.
When adjusted to flank or jflank the sound path mea-
surement is made at the point of intersection of the
monitor gate with the rising flank of the
highest
echo in
the gate.
measured soundpath: 19,44 mm
amplitude: 94 %
A Attention:
The highest echo in the gate does not have to be the
echo for which the sound path has been measured. This
may lead to false echo evaluation!
Configuring the USM 35X for a test application

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