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GE Krautkramer USM 35X - Page 70

GE Krautkramer USM 35X
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5-22 Issue 01, 04/2005 Krautkramer USM 35X
Operation Calibrating the USM 35X
Higher material velocity
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, es-
pecially with small thicknesses. This is typical of dual-
element (TR) probes and serves for compensation of
the V-path error.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be espe-
cially taken into account with thicknesses less than
2 mm/0.08".
A stepped reference block having different wall thick-
nesses is required for calibration. The wall thicknesses
must be selected so that they cover the expected read-
ings.
Calibration process:
We recommend to use the semiautomatic calibration
function for the calibration with T/R probes.
Set the required test range.
Increase the probe delay (P-DELAY) until the two
calibration lines are displayed within the range.
Set the pulser and receiver functions according to
the probe used and the test application.
Set the function TOF (function group MEAS) to
flank.
Vary the gain so that the highest echo reaches
approximately the full screen height.
Set the gate threshold to the required height for
measuring the sound paths at the echo flanks.
Select the function group CAL.
Enter the distances of the two calibration echoes in
S-REF1 and S-REF2.
Position the gate (function aSTART) on the first
calibration echo.
Press
to record the first calibration echo.
Couple the probe to the calibration block containing
the second calibration line, and set the height so that
it’s about as high as the first calibration echo.
Move the gate to the second calibration echo.
5-22 Issue 01, 04/2005 Krautkramer USM 35X
Operation Calibrating the USM 35X
Higher material velocity
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, es-
pecially with small thicknesses. This is typical of dual-
element (TR) probes and serves for compensation of
the V-path error.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be espe-
cially taken into account with thicknesses less than
2 mm/0.08".
A stepped reference block having different wall thick-
nesses is required for calibration. The wall thicknesses
must be selected so that they cover the expected read-
ings.
Calibration process:
We recommend to use the semiautomatic calibration
function for the calibration with T/R probes.
Set the required test range.
Increase the probe delay (P-DELAY) until the two
calibration lines are displayed within the range.
Set the pulser and receiver functions according to
the probe used and the test application.
Set the function TOF (function group MEAS) to
flank.
Vary the gain so that the highest echo reaches
approximately the full screen height.
Set the gate threshold to the required height for
measuring the sound paths at the echo flanks.
Select the function group CAL.
Enter the distances of the two calibration echoes in
S-REF1 and S-REF2.
Position the gate (function aSTART) on the first
calibration echo.
Press
to record the first calibration echo.
Couple the probe to the calibration block containing
the second calibration line, and set the height so that
it’s about as high as the first calibration echo.
Move the gate to the second calibration echo.

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