3 Short-Range Comms & IoT Mode
3.8 SEM Measurement
3.8 SEM Measurement
The Spectrum Emission Mask measurement analyzes spurious signal levels in up to
six pairs of offset frequencies and relates them to the carrier power.
SEM Measurement Commands
The following commands and queries can be used to configure the measurement,
then retrieve measurement results:
The general functionality of "CONFigure" on page 2431, "INITiate" on page 2432,
"FETCh" on page 2432, "MEASure" on page 2434, and "READ" on page 2433 are
described in the section SCPI Operation and Results Query in the topic
Programming the Instrument.
Note that, in general, :CONF:<measurement> resets the specified measurement
settings to their defaults. X-Series permits the addition of the NDEFault node to the
command, which prevents a measurement preset after a measurement switch.
:CONFigure:SEMask
:CONFigure:SEMask:NDEFault
:INITiate:SEMask
:FETCh:SEMask[n]?
:MEASure:SEMask[n]?
:READ:SEMask[n]?
Remote Command Results Overview
The following table provides an overview of the results returned by the :FETCh,
:MEASure, and :READ queries listed above, according to the index value n. For
Mode-specific details, click on the appropriate link for each n value.
Offsets that are turned off (inactive) return -999.0 or NAN when their results are
queried via SCPI. The value of NAN is 9.91E+37.
n Results
1 Result summary (Offsets A - F)
Note that n = 1 returns results of 6 offsets (Offset A to F)
See "Results for n = 1" on page 1012
2 Displayed frequency domain spectrum trace data for Trace 1
See "Results for n = 2-4" on page 1013
3 Displayed frequency domain absolute limit trace data
See "Results for n = 2-4" on page 1013
4 Displayed frequency domain relative limit trace data
1010 Short Range Comms & IoT Mode User's &Programmer's Reference
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