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SICK scanGrid2 I/O User Manual

SICK scanGrid2 I/O
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The categories differ in regards to the method of troubleshooting, and the measures
r
equired to restore the safe multibeam scanner to normal operation.
The safe multibeam scanner creates an entry in the message history for each error.
Recoverable error
F
or a recoverable error, all safety outputs switch to the OFF state.
As soon as you have eliminated the cause of the error, the safety outputs switch back to
the ON state.
The following errors are classified as recoverable errors:
Invalid signal for monitoring case switching
Contamination error (front screen)
Supply voltage to the safe multibeam scanner too low
Ambient light intensity exceeds the ambient light immunity of the safe multibeam
scanner
Configuration error
F
or a configuration error, all safety outputs switch to the OFF state.
You need to check the configuration in Safety Designer and, if necessary, reconfigure
the device.
Device error
D
evice errors are serious errors where all safety outputs switch to the OFF state and the
device switches to the locking state.
Once the cause of the error has been rectified, you need to restart the device.
11.4 Diagnostics using Safety Designer
The following diagnostics tools are available in the device window:
Me
ssage history
Data recorder
The diagnostic data are transferred via the USB connection.
3)
11.4.1 Message history
On the Me
ssage history page, you can see all errors, warnings and information about the
device. You have the option of saving or printing the message history as a PDF. You can
also delete the entries in the message history.
3)
T
he USB connection may only be used temporarily and only for configuration and diagnostics.
TROUBLESHOOTING 11
8025936/2021-01-08 | SICK O P E R A T I N G I N S T R U C T I O N S | scanGrid2 I/O
67
Subject to change without notice

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SICK scanGrid2 I/O Specifications

General IconGeneral
BrandSICK
ModelscanGrid2 I/O
CategoryScanner
LanguageEnglish

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