SICK scanGrid2 I/O User Manual

Measurement error with mea‐
sur
ement data output
Typ. ± 60 mm
1)
In the event of heavy contamination, the safe multibeam scanner displays a contamination error and
s
witches all safety outputs to the OFF state.
2)
In close proximity (50 mm-wide area in front of the front screen), the detection capability of the safe
multibeam scanner may be restricted.
3)
This laser product is rated as a class 1 laser according to IEC 60825-1:2014. In some cases, evaluation
is required according to the older IEC 60825-1:2007 standard, e.g. by employers in the EU according
to Directive 2006/25 / EC. According to the older IEC 60825-1:2007 standard, laser class 1M must be
used as the basis.
13.2 Response time
Overview
T
he protective device’s response time is the maximum time between the occurrence of
the event leading to the sensor’s response and supply of the switch-off signal to the
protective device’s interface (for example OFF state of the OSSD pair).
In addition to the response time of the safe multibeam scanner, further signal trans‐
mission and processing also influence the time up until the end of the dangerous
state. This includes a control’s processing time and the response times of downstream
contactors, for example.
Response time
T
he response time of the safe multibeam scanner depends, among other things, on the
set multiple sampling.
You can calculate the response time using the following formula:
t
R
= n × t
SC
+ t
RO
Where:
•
t
R
= Response time of the safe multibeam scanner
•
n = Set multiple sampling (default: n = 1)
•
t
SC
= Scan cycle time (≤ 46 ms)
•
t
RO
= Supplement for the response time (≤ 14 ms for protective fields and ≤ 25 ms
for warning fields)
Calculation example:
•
t
R
= 1 × 46 ms + 14 ms = 60 ms (protective field, n = 1)
•
t
R
= 2 × 46 ms + 25 ms = 117 ms (warning field, n = 2)
Cascade
W
hen using up to four safe multibeam scanners in a cascade, the response time
increases by up to 28 ms.
You can calculate the exact value using the load capacitance:
t
E
= 2.32 x 10
4
Ω x C + 5 ms
Where:
•
t
E
= Increase in response time in the cascade (ms)
•
C = Load capacitance ( ≤ 1 µF)
Further topics
•
"R
esponse time of the safe multibeam scanner", page 19
•
"Monitoring case switching", page 19
•
"Cascading", page 32
TECHNICAL DATA 13
8025936/2021-01-08 | SICK O P E R A T I N G I N S T R U C T I O N S | scanGrid2 I/O
77
Subject to change without notice

SICK scanGrid2 I/O Specifications

General

Brand	SICK
Model	scanGrid2 I/O
Category	Scanner
Language	English