GE Krautkramer USM 35X - Page 213

Technical specifications according to EN 12668-1
Technical specifications according to EN 12668-1Technical specifications according to EN 12668-1
Technical specifications according to EN 12668-1
Description
DescriptionDescription
Description Symbol
SymbolSymbol
Symbol Dimension
DimensionDimension
Dimension Min
MinMin
Min Average
AverageAverage
Average Max
MaxMax
Max Comment
CommentComment
Comment
GE Inspection Technologies USM 35X S_TM036060001_D-11
»» Diameter mm/inch 10 - 2000 flat
0,40 - 800 flat
mm
inch
» Image processing
» Image processing» Image processing
» Image processing - - -
»» Readings to be displayed - 5 -
»»» Time of flight - yes - For Gate A, B
»»» Sound path difference - B-A - For Gate A, B
»»» Surface distance - yes - For Gate A, B
»»» Red. surface distance - yes - For Gate A, B
»»» Depth position - yes - For Gate A, B
»»» Amplitude in % - yes - For Gate A, B
»»» Amplitude in dB - yes -- to gate threshold
to reference (REF)
for USM 35X DAC/S
to reference curve
»»» Amplitude in % curve - yes - * Only USM 35X DAC
and S
for gate A,B
to reference curve
»»» Amplitude as ERS - yes - * Only USM 35X S
for gate A
»»» Alarm - yes - For Gate A,B
»»» Evaluation curve (DGS) - yes - * only for USM 35X S
»»» Test sensitivity - yes - * only for USM 35X S
Technical specifications according to EN 12668-1
Technical specifications according to EN 12668-1Technical specifications according to EN 12668-1
Technical specifications according to EN 12668-1
Description
DescriptionDescription
Description Symbol
SymbolSymbol
Symbol Dimension
DimensionDimension
Dimension Min
MinMin
Min Average
AverageAverage
Average Max
MaxMax
Max Comment
CommentComment
Comment
GE Inspection Technologies USM 35X S_TM036060001_D-11
»» Diameter mm/inch 10 - 2000 flat
0,40 - 800 flat
mm
inch
» Image processing
» Image processing» Image processing
» Image processing - - -
»» Readings to be displayed - 5 -
»»» Time of flight - yes - For Gate A, B
»»» Sound path difference - B-A - For Gate A, B
»»» Surface distance - yes - For Gate A, B
»»» Red. surface distance - yes - For Gate A, B
»»» Depth position - yes - For Gate A, B
»»» Amplitude in % - yes - For Gate A, B
»»» Amplitude in dB - yes -- to gate threshold
to reference (REF)
for USM 35X DAC/S
to reference curve
»»» Amplitude in % curve - yes - * Only USM 35X DAC
and S
for gate A,B
to reference curve
»»» Amplitude as ERS - yes - * Only USM 35X S
for gate A
»»» Alarm - yes - For Gate A,B
»»» Evaluation curve (DGS) - yes - * only for USM 35X S
»»» Test sensitivity - yes - * only for USM 35X S