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Hioki PQ3198
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A9
Appendix
Voltage Waveform Comparison
Measurement method:
A judgment area is automatically generated from the previous 200 ms aggregation waveform, and events are gener-
ated based on a comparison with the judgment waveform.
Waveform comparison is performed at once for the entire 200 ms ag
gregation. Thresholds are applied as a percent-
age of the nominal input voltage RMS value.
Event IN and OUT:
Event IN : First time at which waveform diverges from judgment area
Event OUT : None
Judgment area
Judgment waveform
Event IN
Threshold
(% of nominal input voltage)
Threshold
(% of nominal input voltage)
Dotted line: Judgment area
Solid line: Judgment waveform (measured waveform)
Approx. 200 ms aggregation Approx. 200 ms aggregation
HIOKI PQ3198A961-02

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