Chapter 1
System Overview
1
Luna Technologies’ Optical Backscatter Reflectometer (OBR) is the industry’s first
ultra-high resolution reflectometry device with backscatter-level sensitivity for
interrogating components or systems. The OBR uses swept-wavelength coherent
interferometry to measure minute reflections in an optical system as a function of
length. This technique measures the full scalar response of the device under test
(DUT), including both phase and amplitude information.
Data is presented graphically, providing the user with unprecedented optical-module
inspection and diagnostic capabilities. The data may be used to:
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