Sun Microsystems UltraSPARC-I - Introduction; Interface; D.1 Introduction

Sun Microelectronics
329
IEEE 1149.1 Scan Interface D
D.1 Introduction
UltraSPARC provides an IEEE Std 1149.1-1990 compliant test access port (TAP)
and boundary scan architecture. The primary use of 1149.1 scan interface is for
board-level interconnect testing and diagnosis.
The IEEE 1149.1 test access port and boundary scan architecture consists of three
major parts:
• A test access port controller
• An instruction register
• Numerous public and private test data registers
For information about how to obtain a copy of IEEE Std 1149.1-1990, see the Bib-
liography.
D.2 Interface
The IEEE Std 1149.1-1990 serial scan interface is composed of a set of pins and a
TAP controller state machine that responds to the pins. The five wire IEEE 1149.1
interface is used in UltraSPARC. Table D-1 describes the five pins.
Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com