Sun Microsystems UltraSPARC-I - D. IEEE 1149.1 Scan Interface

Sun Microelectronics
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D. IEEE 1149.1 Scan Interface
D.3.3 SELECT-DR-SCAN
A temporary state in which all test data registers retain their previous state.
SELECT-IR-SCANSELECT-DR-SCANRUN-TEST/IDLE
TEST-LOGIC-RESET
CAPTURE-IRCAPTURE-DR
EXIT-2-IREXIT-1-DR
PAUSE-DR
EXIT-2-IREXIT-2-DR
UPDATE-IRUPDATE-DR
0
PAUSE-IR
SHIFT-DR
0
SHIFT-IR
1 01
1
1
1
0
0
0
1
1
00
0
1
1
0
1
0
0
0
1
11
0
1
Figure D-1 TAP Controller State Diagram
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