Sun Microsystems UltraSPARC-I User Manual

Sun Microelectronics
334
UltraSPARC User’s Manual
D.5.1 Public Instructions
D.5.1.1 BYPASS
Select the BYPASS register as the active test data register.
D.5.1.2 SAMPLE/PRELOAD
Selects the boundary scan register as the active test data register. This instruction
allows for the observing of the I/O pins or shifting in of a value to the boundary
scan chain without disturbing the normal processor operation.
D.5.1.3 EXTEST
Selects the boundary scan register as the active test data register. Used to perform
board level interconnect testing. When active the boundary scan chain drive the
processor pins. Therefore, UltraSPARC cannot operate in its normal functional
mode.
Table D-3 IEEE 1149.1 Instruction Encodings
Instruction IR encoding Scan Chain
BYPASS FF
16
bypass
IDCODE FE
16
id register
EXTEST 00
16
boundary
SAMPLE 07
16
boundary
INTEST 01
16
boundary
PLLMODE 9F
16
pll mode
CLKCTRL 9D
16
clock control
RAMWCP BD
16
ram control
POWERCUT 8E
16
N/A
HIGHZ FD
16
bypass
INTEST2 8F
16
boundary
FULLSCAN 40
16
..7F
16
internal
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Sun Microsystems UltraSPARC-I Specifications

General

Brand	Sun Microsystems
Model	UltraSPARC-I
Category	Computer Hardware
Language	English