Sun Microelectronics
vii
Contents
C.3 Power-Up...................................................................................................................... 328
D. IEEE 1149.1 Scan Interface................................................................................................... 329
D.1 Introduction.................................................................................................................. 329
D.2 Interface ........................................................................................................................ 329
D.3 Test Access Port (TAP) Controller ............................................................................ 330
D.4 Instruction Register..................................................................................................... 333
D.5 Instructions................................................................................................................... 333
D.6 Public Test Data Registers.......................................................................................... 335
E. Pin and Signal Descriptions ............................................................................................... 337
E.1 Introduction.................................................................................................................. 337
E.2 Pin Descriptions........................................................................................................... 337
E.3 Signal Descriptions...................................................................................................... 341
F. ASI Names.............................................................................................................................. 345
F.1 Introduction.................................................................................................................. 345
G. Differences Between UltraSPARC Models...................................................................... 351
G.1 Introduction.................................................................................................................. 351
G.2 Summary....................................................................................................................... 351
G.3 References to Model-Specific Information............................................................... 352
Back Matter
Glossary .................................................................................................................................. 357
Bibliography .......................................................................................................................... 363
General References...................................................................................................... 363
Sun Microelectronics (SME) Publications................................................................ 364
How to Contact SME................................................................................................... 365
On Line Resources....................................................................................................... 365
Index ........................................................................................................................................ 367
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