17-34 SCPI Command Reference
:SOURce2 <NRf> |<NDN>
:CALCulate2:LIMit[1]:COMPliance:SOURce2 <NRf> |<NDN> Specify pattern; LIMIT 1 failure
:CALCulate2:LIMitx:LOWer:SOURce2 <NRf>|<NDN> Specify pattern for grading mode; lower
LIMIT x failure (x = 2, 3, 5-12)
:CALCulate2:LIMitx:UPPer:SOURce2 <NRf>|<NDN> Specify pattern for grading mode; upper
LIMIT x failure (x = 2, 3, 5-12)
Parameters <NRf> = 0 to 7 (3-bit) Decimal value
0 to 15 (4-bit) Decimal value
<NDN> = 0 to #b111 (3-bit) Binary value
0 to #b1111 (4-bit) Binary value
0 to #q7 (3-bit) Octal value
0 to #q17 (4-bit) Octal value
0 to #h7 (3-bit) Hexadecimal value
0 to #hF (4-bit) Hexadecimal value
Query :SOURce2? Query source value for specified limit
Description These commands are used to define the digital output “fail” patterns for the
specified tests (0 to 7, 3-bit; 0 to 15, 4-bit). Note that the “fail” patterns for
Limits 2, 3, and 5-12 apply only to the grading mode.
Tests are performed in the following order:
1. Limit Test 1
2. Limit Test 2
A. Lower Limit 2
B. Upper Limit 2
3. Limit Test x, where x = 3, 5-12 in ascending numerical order.
A. Lower Limit x
B. Upper Limit x
The first failure in the test sequence determines the bit pattern for the digital
output port. Subsequent failures in the test sequence will not change the
defined digital output pattern. Note that the output value can be specified as
a binary, octal, decimal, or hexadecimal value.
NOTE 16-bit I/O is available with the 2499-DIGIO option. The maximum 16-bit output
value is 65535.
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