4: Pulse card concepts Model 4200A-SCS Pulse Card (PGU and PMU)
4-16 4200A-PMU-900-01 Rev. B March 2023
KPulse full arb waveforms
The Keithley Pulse tool (KPulse) is a software application used to control the optional pulse generator
cards. KPulse can be used to create, save, and output full arb waveforms. It also provides a collection
of basic full arb waveform types such as sine, square, triangle, noise, Gaussian, and calculation. After
configuring one of the basic waveform types, you can save it as a .kaf file.
Once a full arb waveform is saved as a .kaf file, it can be imported back into KPulse. The waveform
can also be loaded into the pulse generator card using the arb_file function. For more information,
refer to KPulse full arb waveforms (on page 4-16
).
Pulse waveforms for nonvolatile memory testing
The pulse card has several attributes that support nonvolatile memory (NVM) testing.
To perform the multi-level pulse waveforms for the typical program/erase waveform, each pulse card
channel uses the Segment Arb mode. For more information about Segment Arb waveforms, refer to
Segment Arb waveforms (on page 5-6
). The ability to disconnect, or float, a particular device pin in
the Segment Arb waveform requires an inline solid-state relay.
The pulse card output channels each have 50 Ω output impedance for most ranges. When current
flows through the pulse channel, there is a voltage drop across this 50 Ω resistor internal to the pulse
card. This dictates that the voltage at the output may be different from what is expected based on the
resistance of the DUT. This effect is called the load-line effect. For more information on the load-line
effect and how to compensate for it, refer to Load-line effect compensation (LLEC) for the PMU
(on
page 2-24).
The DUT resistance determines pulse voltage across DUT:
• The gate of a flash or NVM device has high impedance.
• The voltage at the gate is double of the programmed voltage.
• The voltage at the drain is a function of the resistance of the drain-source, as mentioned above.
Adjusting the pulse level to match the expected drain voltage is performed iteratively with an
oscilloscope to measure V
D
during the pulse.
The methods used to define the multi-level waveforms used in flash memory testing include using the
subsite stress/measure looping feature of Clarius. Use the KPulse application to define each unique
voltage waveform. Refer to KPulse (on page 5-1
) for details.
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